The sequence is corresponding to the entry of KWMTBOMO04857 in Silkbase, or the entry of ...The sequence is corresponding to the entry of KWMTBOMO04857 in Silkbase, or the entry of BMSK0004751.1 in the SilkDB 3.0. It is consist with the partial sequence of XP_037868953.1 (NCBI number, 16-282aa).
解像度: 2.89→45.69 Å / Cor.coef. Fo:Fc: 0.936 / Cor.coef. Fo:Fc free: 0.913 / 交差検証法: THROUGHOUT / ESU R: 0.601 / ESU R Free: 0.366 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Selection details
Rfree
0.2916
645
5.126 %
RANDOM
Rwork
0.2505
11937
-
-
all
0.253
-
-
-
obs
-
12582
99.644 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 112.028 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.303 Å2
0 Å2
0 Å2
2-
-
-1.303 Å2
0 Å2
3-
-
-
2.605 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.89→45.69 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2126
0
26
6
2158
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.003
0.013
2216
X-RAY DIFFRACTION
r_bond_other_d
0.18
0.017
2044
X-RAY DIFFRACTION
r_angle_refined_deg
1.224
1.645
2991
X-RAY DIFFRACTION
r_angle_other_deg
2.489
1.583
4752
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.457
5
257
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.045
22.602
123
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
18.961
15
409
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.589
15
13
X-RAY DIFFRACTION
r_chiral_restr
0.044
0.2
282
X-RAY DIFFRACTION
r_gen_planes_refined
0.038
0.02
2431
X-RAY DIFFRACTION
r_gen_planes_other
0.03
0.02
487
X-RAY DIFFRACTION
r_nbd_refined
0.188
0.2
425
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.219
0.2
1973
X-RAY DIFFRACTION
r_nbtor_refined
0.161
0.2
1024
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.067
0.2
1006
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.164
0.2
48
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.192
0.2
15
X-RAY DIFFRACTION
r_nbd_other
0.256
0.2
43
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.151
0.2
3
X-RAY DIFFRACTION
r_mcbond_it
2.532
11.972
1031
X-RAY DIFFRACTION
r_mcbond_other
2.53
11.972
1031
X-RAY DIFFRACTION
r_mcangle_it
4.532
17.966
1287
X-RAY DIFFRACTION
r_mcangle_other
4.531
17.962
1288
X-RAY DIFFRACTION
r_scbond_it
1.956
12.165
1184
X-RAY DIFFRACTION
r_scbond_other
1.974
12.164
1184
X-RAY DIFFRACTION
r_scangle_it
3.625
18.121
1703
X-RAY DIFFRACTION
r_scangle_other
3.624
18.118
1704
X-RAY DIFFRACTION
r_lrange_it
7.356
133.978
2435
X-RAY DIFFRACTION
r_lrange_other
7.356
133.968
2436
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20