温度: 293 K / 手法: batch mode 詳細: CTX-M-14 microcrystals for SFX were produced using a seeding approach. Crystals were grown by sitting drop vapor diffusion at 290 overnight mixing 1 microliter CTX-M-14 at 20 mg ml-1 and 1 ...詳細: CTX-M-14 microcrystals for SFX were produced using a seeding approach. Crystals were grown by sitting drop vapor diffusion at 290 overnight mixing 1 microliter CTX-M-14 at 20 mg ml-1 and 1 microliter precipitant (40 % PEG8000, 200 mM lithium sulfate, 100 mM sodium acetate). Obtained crystals (space group P212121) were crushed and a seed stock was prepared. To obtain microcrystals the undiluted seedstock was used for batch crystallization setups by mixing volumes of 50 % CTX-M-14 with 10 % undiluted seed stock and 40 % precipitant solution.
-
データ収集
回折
平均測定温度: 290 K / Serial crystal experiment: Y
放射光源
由来: 自由電子レーザー / サイト: European XFEL / ビームライン: SPB/SFX / 波長: 1.33 Å
検出器
タイプ: AGIPD / 検出器: PIXEL / 日付: 2018年4月1日
放射
プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1.33 Å / 相対比: 1
反射
解像度: 1.69→34.603 Å / Num. obs: 27838 / % possible obs: 99.89 % / 冗長度: 65.99 % / R split: 0.197 / Net I/σ(I): 4.37