ソフトウェア | 名称 | バージョン | 分類 |
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BUSTER | 2.10.1精密化 | XDS | | データ削減 | SCALA | | データスケーリング | MOLREP | | 位相決定 | |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 2.5→46.84 Å / Cor.coef. Fo:Fc: 0.9288 / Cor.coef. Fo:Fc free: 0.9275 / SU R Cruickshank DPI: 0.239 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.259 / SU Rfree Blow DPI: 0.202 / SU Rfree Cruickshank DPI: 0.195
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.2452 | 1620 | 5 % | RANDOM |
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Rwork | 0.2316 | - | - | - |
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obs | 0.2323 | 32398 | 99.99 % | - |
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原子変位パラメータ | Biso mean: 64.9 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0 Å2 | 0 Å2 | 0 Å2 |
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2- | - | 0 Å2 | 0 Å2 |
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3- | - | - | 0 Å2 |
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Refine analyze | Luzzati coordinate error obs: 0.414 Å |
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精密化ステップ | サイクル: 1 / 解像度: 2.5→46.84 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 3004 | 0 | 0 | 287 | 3291 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | 数 | Restraint function | Weight |
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X-RAY DIFFRACTION | t_bond_d0.009 | 3068 | HARMONIC2 | X-RAY DIFFRACTION | t_angle_deg1.08 | 4120 | HARMONIC2 | X-RAY DIFFRACTION | t_dihedral_angle_d | 1110 | SINUSOIDAL2 | X-RAY DIFFRACTION | t_incorr_chiral_ct | | | | X-RAY DIFFRACTION | t_pseud_angle | | | | X-RAY DIFFRACTION | t_trig_c_planes | 98 | HARMONIC2 | X-RAY DIFFRACTION | t_gen_planes | 432 | HARMONIC5 | X-RAY DIFFRACTION | t_it | 3068 | HARMONIC20 | X-RAY DIFFRACTION | t_nbd | | | | X-RAY DIFFRACTION | t_omega_torsion2.83 | | | | X-RAY DIFFRACTION | t_other_torsion21.62 | | | | X-RAY DIFFRACTION | t_improper_torsion | | | | X-RAY DIFFRACTION | t_chiral_improper_torsion | 374 | SEMIHARMONIC5 | X-RAY DIFFRACTION | t_sum_occupancies | | | | X-RAY DIFFRACTION | t_utility_distance | | | | X-RAY DIFFRACTION | t_utility_angle | | | | X-RAY DIFFRACTION | t_utility_torsion | | | | X-RAY DIFFRACTION | t_ideal_dist_contact | 3470 | SEMIHARMONIC4 | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.5→2.58 Å / Total num. of bins used: 16
| Rfactor | 反射数 | %反射 |
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Rfree | 0.3095 | 148 | 5.02 % |
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Rwork | 0.3139 | 2798 | - |
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all | 0.3137 | 2946 | - |
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obs | - | - | 99.99 % |
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精密化 TLS | S33: -0.0392 Å ° / 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 0.306 | 0.2702 | -0.0125 | 0.6661 | 0.0411 | 0.1348 | 0.0059 | -0.058 | -0.02 | 0.0377 | 0.0333 | 0.0497 | 0.0266 | -0.0016 | 0.0101 | -0.029 | -0.031 | -0.1158 | 0.0117 | 0.0687 | 91.4734 | -20.3414 | 49.0635 | 2 | 0.0765 | -0.0299 | -0.0084 | 0.6893 | -0.2064 | 0.2084 | 0.0015 | 0.0669 | 0.0034 | 0.0074 | 0.0377 | 0.0926 | -0.0326 | -0.0117 | 0.0207 | 0.0312 | -0.0051 | -0.0977 | -0.0147 | 0.0442 | 88.6301 | 0.7368 | 36.5997 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Selection details |
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1 | X-RAY DIFFRACTION | 1 | { A|* }2 | X-RAY DIFFRACTION | 2 | { B|* } | |
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