ソフトウェア | 名称 | バージョン | 分類 |
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PHENIX | 1.9_1692精密化 | iMOSFLM | | データ削減 | SCALA | | データスケーリング | PHASER | | 位相決定 | |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 2.22→62.731 Å / SU ML: 0.28 / 交差検証法: THROUGHOUT / σ(F): 1.35 / 位相誤差: 24.04 / 立体化学のターゲット値: ML
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.2357 | 4019 | 4.99 % | RANDOM |
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Rwork | 0.2078 | - | - | - |
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obs | 0.2092 | 80484 | 99.74 % | - |
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溶媒の処理 | 減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL |
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精密化ステップ | サイクル: LAST / 解像度: 2.22→62.731 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 7344 | 0 | 259 | 637 | 8240 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | 数 |
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X-RAY DIFFRACTION | f_bond_d0.004 | 7716 | X-RAY DIFFRACTION | f_angle_d1.002 | 10355 | X-RAY DIFFRACTION | f_dihedral_angle_d17.922 | 2798 | X-RAY DIFFRACTION | f_chiral_restr0.036 | 1053 | X-RAY DIFFRACTION | f_plane_restr0.003 | 1359 | | | | | |
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LS精密化 シェル | 解像度 (Å) | Rfactor Rfree | Num. reflection Rfree | Rfactor Rwork | Num. reflection Rwork | Refine-ID | % reflection obs (%) |
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2.22-2.2461 | 0.3045 | 121 | 0.3187 | 2614 | X-RAY DIFFRACTION | 99 | 2.2461-2.2735 | 0.3313 | 134 | 0.316 | 2537 | X-RAY DIFFRACTION | 99 | 2.2735-2.3023 | 0.322 | 140 | 0.3101 | 2592 | X-RAY DIFFRACTION | 98 | 2.3023-2.3326 | 0.3497 | 122 | 0.2905 | 2592 | X-RAY DIFFRACTION | 99 | 2.3326-2.3646 | 0.3523 | 130 | 0.2802 | 2620 | X-RAY DIFFRACTION | 100 | 2.3646-2.3983 | 0.2896 | 139 | 0.2677 | 2612 | X-RAY DIFFRACTION | 100 | 2.3983-2.4341 | 0.3076 | 140 | 0.2607 | 2604 | X-RAY DIFFRACTION | 100 | 2.4341-2.4722 | 0.2644 | 148 | 0.2453 | 2599 | X-RAY DIFFRACTION | 100 | 2.4722-2.5127 | 0.2892 | 145 | 0.2454 | 2601 | X-RAY DIFFRACTION | 100 | 2.5127-2.556 | 0.2825 | 130 | 0.2388 | 2634 | X-RAY DIFFRACTION | 100 | 2.556-2.6025 | 0.2673 | 131 | 0.2295 | 2622 | X-RAY DIFFRACTION | 100 | 2.6025-2.6526 | 0.2552 | 140 | 0.2262 | 2592 | X-RAY DIFFRACTION | 100 | 2.6526-2.7067 | 0.2652 | 140 | 0.2248 | 2633 | X-RAY DIFFRACTION | 100 | 2.7067-2.7656 | 0.2408 | 143 | 0.2163 | 2615 | X-RAY DIFFRACTION | 100 | 2.7656-2.8299 | 0.2712 | 131 | 0.2029 | 2627 | X-RAY DIFFRACTION | 100 | 2.8299-2.9007 | 0.2272 | 125 | 0.2206 | 2663 | X-RAY DIFFRACTION | 100 | 2.9007-2.9791 | 0.2247 | 121 | 0.2056 | 2614 | X-RAY DIFFRACTION | 100 | 2.9791-3.0668 | 0.2487 | 125 | 0.212 | 2645 | X-RAY DIFFRACTION | 100 | 3.0668-3.1657 | 0.256 | 149 | 0.2228 | 2615 | X-RAY DIFFRACTION | 100 | 3.1657-3.2789 | 0.2435 | 153 | 0.2229 | 2645 | X-RAY DIFFRACTION | 100 | 3.2789-3.4102 | 0.2819 | 136 | 0.2059 | 2648 | X-RAY DIFFRACTION | 100 | 3.4102-3.5654 | 0.2108 | 155 | 0.1941 | 2620 | X-RAY DIFFRACTION | 100 | 3.5654-3.7533 | 0.2217 | 149 | 0.1833 | 2642 | X-RAY DIFFRACTION | 100 | 3.7533-3.9884 | 0.2108 | 134 | 0.1866 | 2660 | X-RAY DIFFRACTION | 100 | 3.9884-4.2963 | 0.2042 | 143 | 0.177 | 2672 | X-RAY DIFFRACTION | 100 | 4.2963-4.7285 | 0.1818 | 143 | 0.1613 | 2677 | X-RAY DIFFRACTION | 100 | 4.7285-5.4124 | 0.1766 | 146 | 0.1683 | 2706 | X-RAY DIFFRACTION | 100 | 5.4124-6.8178 | 0.2288 | 167 | 0.1939 | 2703 | X-RAY DIFFRACTION | 100 | 6.8178-62.7562 | 0.2458 | 139 | 0.2215 | 2861 | X-RAY DIFFRACTION | 100 |
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精密化 TLS | 手法: refined / Origin x: -26.1797 Å / Origin y: 2.0739 Å / Origin z: -3.5018 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | 0.2002 Å2 | 0.0059 Å2 | -0.0015 Å2 | - | 0.2332 Å2 | 0.0087 Å2 | - | - | 0.2307 Å2 |
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L | 0.1246 °2 | -0.0181 °2 | 0.0552 °2 | - | 0.3756 °2 | 0.0301 °2 | - | - | 0.1643 °2 |
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S | -0.0174 Å ° | 0.0142 Å ° | 0.0032 Å ° | 0.0032 Å ° | 0.0113 Å ° | -0.0216 Å ° | 0.0113 Å ° | 0.0298 Å ° | -0 Å ° |
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精密化 TLSグループ | Selection details: all |
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