解像度: 2.45→66.642 Å / SU ML: 0.38 / σ(F): 1.34 / 位相誤差: 30.67 / 立体化学のターゲット値: ML 詳細: RESIDUES 2, 23-25,263-267,282-286,AND 498-507 ARE DISORDERED AND NOT SEEN IN THE CRYSTAL STRUCTURE
Rfactor
反射数
%反射
Rfree
0.2617
964
5.1 %
Rwork
0.1917
-
-
obs
0.1952
18767
97.11 %
溶媒の処理
減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL
精密化ステップ
サイクル: LAST / 解像度: 2.45→66.642 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3717
0
66
7
3790
拘束条件
Refine-ID
タイプ
Dev ideal
数
X-RAY DIFFRACTION
f_bond_d
0.01
3893
X-RAY DIFFRACTION
f_angle_d
1.442
5289
X-RAY DIFFRACTION
f_dihedral_angle_d
15.417
1490
X-RAY DIFFRACTION
f_chiral_restr
0.054
585
X-RAY DIFFRACTION
f_plane_restr
0.008
666
LS精密化 シェル
解像度 (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Refine-ID
% reflection obs (%)
2.4502-2.5793
0.3504
124
0.2927
2516
X-RAY DIFFRACTION
97
2.5793-2.7409
0.3731
156
0.2813
2495
X-RAY DIFFRACTION
98
2.7409-2.9526
0.3585
147
0.2738
2523
X-RAY DIFFRACTION
98
2.9526-3.2497
0.3285
135
0.262
2541
X-RAY DIFFRACTION
97
3.2497-3.7199
0.3139
141
0.2231
2501
X-RAY DIFFRACTION
97
3.7199-4.6865
0.2125
135
0.1576
2562
X-RAY DIFFRACTION
97
4.6865-66.6667
0.208
126
0.1483
2665
X-RAY DIFFRACTION
96
精密化 TLS
手法: refined / Origin x: -19.3037 Å / Origin y: -23.7738 Å / Origin z: -13.3766 Å