ソフトウェア | 名称: PHENIX / バージョン: (phenix.refine: 1.7_650) / 分類: 精密化 |
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精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 4EPP 解像度: 2.399→36.771 Å / SU ML: 0.29 / σ(F): 2 / 位相誤差: 23.61 / 立体化学のターゲット値: ML
| Rfactor | 反射数 | %反射 |
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Rfree | 0.2307 | 1151 | 5.12 % |
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Rwork | 0.165 | - | - |
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obs | 0.1683 | 22497 | 99.88 % |
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溶媒の処理 | 減衰半径: 0.95 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL / Bsol: 31.925 Å2 / ksol: 0.3 e/Å3 |
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原子変位パラメータ | | Baniso -1 | Baniso -2 | Baniso -3 |
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1- | -0.203 Å2 | -0 Å2 | 0 Å2 |
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2- | - | -0.203 Å2 | -0 Å2 |
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3- | - | - | 0.406 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 2.399→36.771 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 3617 | 0 | 32 | 69 | 3718 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | 数 |
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X-RAY DIFFRACTION | f_bond_d0.008 | 3714 | X-RAY DIFFRACTION | f_angle_d1.151 | 4987 | X-RAY DIFFRACTION | f_dihedral_angle_d16.647 | 1428 | X-RAY DIFFRACTION | f_chiral_restr0.075 | 535 | X-RAY DIFFRACTION | f_plane_restr0.004 | 635 | | | | | |
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LS精密化 シェル | 解像度 (Å) | Rfactor Rfree | Num. reflection Rfree | Rfactor Rwork | Num. reflection Rwork | Refine-ID | % reflection obs (%) |
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2.399-2.5078 | 0.3487 | 167 | 0.2678 | 2634 | X-RAY DIFFRACTION | 99 | 2.5078-2.64 | 0.279 | 146 | 0.2347 | 2631 | X-RAY DIFFRACTION | 100 | 2.64-2.8054 | 0.278 | 143 | 0.2019 | 2668 | X-RAY DIFFRACTION | 100 | 2.8054-3.0219 | 0.2823 | 144 | 0.1995 | 2668 | X-RAY DIFFRACTION | 100 | 3.0219-3.3258 | 0.2519 | 142 | 0.1811 | 2643 | X-RAY DIFFRACTION | 100 | 3.3258-3.8066 | 0.2351 | 159 | 0.1652 | 2672 | X-RAY DIFFRACTION | 100 | 3.8066-4.7943 | 0.1761 | 126 | 0.1263 | 2703 | X-RAY DIFFRACTION | 100 | 4.7943-36.771 | 0.2005 | 124 | 0.1452 | 2727 | X-RAY DIFFRACTION | 100 |
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精密化 TLS | 手法: refined / Origin x: 4.9511 Å / Origin y: 20.9225 Å / Origin z: -1.0772 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | 0.3492 Å2 | 0.007 Å2 | 0.0115 Å2 | - | 0.119 Å2 | -0.0004 Å2 | - | - | 0.1993 Å2 |
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L | 0.7757 °2 | -0.114 °2 | 0.4394 °2 | - | 1.1361 °2 | 0.4281 °2 | - | - | 1.7716 °2 |
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S | 0.0145 Å ° | -0.0409 Å ° | 0.0972 Å ° | -0.1855 Å ° | 0.0789 Å ° | -0.0249 Å ° | -0.555 Å ° | 0.1055 Å ° | 0.072 Å ° |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Selection details | Auth asym-ID | Auth seq-ID |
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1 | X-RAY DIFFRACTION | 1 | ( CHAIN A AND ( RESID 14:452 OR RESID 501:501 OR RESID 601:669 ) )A14 - 452 | 2 | X-RAY DIFFRACTION | 1 | ( CHAIN A AND ( RESID 14:452 OR RESID 501:501 OR RESID 601:669 ) )A501 | 3 | X-RAY DIFFRACTION | 1 | ( CHAIN A AND ( RESID 14:452 OR RESID 501:501 OR RESID 601:669 ) )A601 - 669 | | | | | | |
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