解像度: 1.85→50 Å / Cor.coef. Fo:Fc: 0.943 / Cor.coef. Fo:Fc free: 0.928 / SU B: 5.526 / SU ML: 0.086 / Isotropic thermal model: ISOTROPIC, TLS / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.136 / ESU R Free: 0.125 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : WITH TLS ADDED
Rfactor
反射数
%反射
Selection details
Rfree
0.216
1746
5 %
RANDOM
Rwork
0.185
-
-
-
all
0.187
34894
-
-
obs
0.187
34713
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 14.51 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.13 Å2
0.06 Å2
-0 Å2
2-
-
0.13 Å2
-0 Å2
3-
-
-
-0.19 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.85→50 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2789
0
6
285
3080
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.013
0.019
2879
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1832
X-RAY DIFFRACTION
r_angle_refined_deg
1.526
1.957
3942
X-RAY DIFFRACTION
r_angle_other_deg
0.962
3
4468
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.423
5
396
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
32.034
23.391
115
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.701
15
410
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.42
15
21
X-RAY DIFFRACTION
r_chiral_restr
0.087
0.2
471
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.021
3337
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
608
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.85→1.9 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.284
124
-
Rwork
0.23
2202
-
obs
-
2525
99.96 %
精密化 TLS
手法: refined / Origin x: -20.93 Å / Origin y: -6.158 Å / Origin z: 13.775 Å