PLEASE SEE PRIMARY CITATION FOR THE DETAILED EXPLANATION OF THE DISCREPANCIES BETWEEN THE UNIPROT ...PLEASE SEE PRIMARY CITATION FOR THE DETAILED EXPLANATION OF THE DISCREPANCIES BETWEEN THE UNIPROT ENTRY AND PROVIDED SEQUENCE
モノクロメーター: single bounce / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.916 Å / 相対比: 1
反射
解像度: 1.6→90.53 Å / Num. all: 46112 / Num. obs: 46112 / % possible obs: 100 %
-
解析
ソフトウェア
名称
バージョン
分類
DNA
データ収集
SHARP
位相決定
REFMAC
5.6.0117
精密化
MOSFLM
データ削減
SCALA
データスケーリング
精密化
構造決定の手法: 多重同系置換 / 解像度: 1.6→90.53 Å / Cor.coef. Fo:Fc: 0.954 / Cor.coef. Fo:Fc free: 0.95 / SU B: 2.984 / SU ML: 0.054 / 交差検証法: THROUGHOUT / ESU R: 0.08 / ESU R Free: 0.079 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN USED IF PRESENT IN THE INPUT
Rfactor
反射数
%反射
Selection details
Rfree
0.22332
2455
5.1 %
RANDOM
Rwork
0.20588
-
-
-
all
0.20677
46112
-
-
obs
0.20677
46112
99.67 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 27.906 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.47 Å2
0.23 Å2
0 Å2
2-
-
0.47 Å2
0 Å2
3-
-
-
-0.7 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.6→90.53 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1828
0
0
263
2091
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.018
0.019
1905
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.818
1.972
2576
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
4.126
5
258
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
38.301
26.512
86
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.876
15
365
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
19.263
15
11
X-RAY DIFFRACTION
r_chiral_restr
0.125
0.2
306
X-RAY DIFFRACTION
r_gen_planes_refined
0.009
0.02
1417
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.598→1.64 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.334
165
-
Rwork
0.266
3088
-
obs
-
-
99.66 %
精密化 TLS
手法: refined / Origin x: 27.799 Å / Origin y: -17.1458 Å / Origin z: -2.7568 Å