ソフトウェア 名称 バージョン 分類 MAR345dtbデータ収集 SHARP位相決定 REFMAC5.5.0102精密化 MOSFLMデータ削減 SCALAデータスケーリング
精密化 構造決定の手法 : 単波長異常分散 / 解像度 : 1.61→43.37 Å / Cor.coef. Fo :Fc : 0.951 / Cor.coef. Fo :Fc free : 0.937 / SU B : 3.423 / SU ML : 0.059 / 交差検証法 : THROUGHOUT / ESU R : 0.093 / ESU R Free : 0.092 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.21325 737 5 % RANDOM Rwork 0.18221 - - - obs 0.18371 13923 99.94 % -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.4 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 14.259 Å2 Baniso -1 Baniso -2 Baniso -3 1- 0.1 Å2 0.05 Å2 0 Å2 2- - 0.1 Å2 0 Å2 3- - - -0.15 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.61→43.37 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 848 0 7 103 958
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.02 0.021 885 X-RAY DIFFRACTION r_bond_other_d0.002 0.02 588 X-RAY DIFFRACTION r_angle_refined_deg1.486 1.929 1206 X-RAY DIFFRACTION r_angle_other_deg2.277 3 1436 X-RAY DIFFRACTION r_dihedral_angle_1_deg5.529 5 116 X-RAY DIFFRACTION r_dihedral_angle_2_deg37.915 23.75 40 X-RAY DIFFRACTION r_dihedral_angle_3_deg10.308 15 145 X-RAY DIFFRACTION r_dihedral_angle_4_deg19.471 15 5 X-RAY DIFFRACTION r_chiral_restr0.1 0.2 135 X-RAY DIFFRACTION r_gen_planes_refined0.008 0.02 1003 X-RAY DIFFRACTION r_gen_planes_other0.006 0.02 188 X-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it1.071 1.5 548 X-RAY DIFFRACTION r_mcbond_other0.184 1.5 229 X-RAY DIFFRACTION r_mcangle_it1.898 2 888 X-RAY DIFFRACTION r_scbond_it2.784 3 337 X-RAY DIFFRACTION r_scangle_it4.306 4.5 314 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 1.611→1.653 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.504 52 - Rwork 0.385 996 - obs - - 99.34 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 6) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 3.7402 -1.4834 2.5348 1.5398 -0.6058 2.9192 0.0655 0.0671 -0.0293 -0.1095 -0.11 0.0751 0.134 0.0836 0.0446 0.1172 0.0179 0.0001 0.1031 0.0084 0.0734 1.174 7.384 71.43 2 1.9886 0.6167 0.2236 0.9848 -0.1872 2.1382 -0.0677 0.0768 0.0762 0.1573 0.0294 -0.1061 -0.1661 0.2559 0.0384 0.0947 -0.031 -0.0047 0.1079 -0.0009 0.0757 7.318 15.034 87.108 3 0.5916 -0.3805 -0.9093 0.453 -0.1305 3.8956 -0.014 -0.012 0.0088 0.0204 -0.0243 -0.013 0.0086 0.083 0.0384 0.0971 -0.0069 -0.0104 0.1006 0.006 0.0713 3.01 11.181 86.149 4 0.6668 -0.5024 -0.415 0.4918 -0.2029 2.7021 0.0317 0.0455 0.0334 0.0034 -0.0595 -0.0213 -0.1363 0.0419 0.0278 0.1092 -0.0038 -0.0006 0.0928 0.0078 0.0672 -0.805 16.715 82.448 5 1.3486 2.3063 -2.167 12.8494 -6.7797 4.5489 0.0925 0.1421 0.0754 -0.2152 0.1032 0.3245 -0.031 -0.2069 -0.1957 0.1289 0.0407 -0.0111 0.1253 0.0171 0.0554 -8.671 18.82 84.144 6 0.0192 0.0571 -0.0654 0.9005 -1.8829 4.1354 -0.0016 -0.008 0.0187 0.0298 0.0649 0.0604 -0.1073 -0.1468 -0.0633 0.1042 0.0188 0.0072 0.0976 0.0164 0.0759 -5.04 16.995 73.811
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A140 - 151 2 X-RAY DIFFRACTION 2 A152 - 172 3 X-RAY DIFFRACTION 3 A173 - 191 4 X-RAY DIFFRACTION 4 A192 - 220 5 X-RAY DIFFRACTION 5 A221 - 231 6 X-RAY DIFFRACTION 6 A232 - 248