モノクロメーター: SI / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.873 Å / 相対比: 1
反射
解像度: 2.84→50 Å / Num. obs: 33135 / % possible obs: 99.1 % / Observed criterion σ(I): -1 / 冗長度: 3.7 % / Biso Wilson estimate: 98.32 Å2 / Rmerge(I) obs: 0.07 / Net I/σ(I): 17.37
反射 シェル
解像度: 2.84→3.01 Å / 冗長度: 3.7 % / Rmerge(I) obs: 0.75 / Mean I/σ(I) obs: 1.89 / % possible all: 96.5
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解析
ソフトウェア
名称
バージョン
分類
XDS
データ削減
XSCALE
データスケーリング
SHARP
位相決定
SHELXD
位相決定
BUSTER
2.8.0
精密化
精密化
構造決定の手法: 単波長異常分散 開始モデル: NONE 解像度: 2.85→45.26 Å / Cor.coef. Fo:Fc: 0.9376 / Cor.coef. Fo:Fc free: 0.9235 / 交差検証法: THROUGHOUT / σ(F): 0 詳細: THE ELECTRON DENSITY FOR THE D, E, F, G AND H IS POOR AND RESIDUES 62-64 WERE OMITTED FROM CHAINS F,G AND H THE DENSITY FOR THE C-TERMINAL HELIX WAS OF GOOD QUALITY IN SUBUNIT A, BUT POOR FOR ...詳細: THE ELECTRON DENSITY FOR THE D, E, F, G AND H IS POOR AND RESIDUES 62-64 WERE OMITTED FROM CHAINS F,G AND H THE DENSITY FOR THE C-TERMINAL HELIX WAS OF GOOD QUALITY IN SUBUNIT A, BUT POOR FOR THE REMAINING SUBUNITS, ESPECIALLY TOWARDS THE END OF THE MODELLED HELIX. HOWEVER, IN SUBUNIT E, BROKEN AND POORLY DEFINED HELICAL DENSITY EXTENDED FURTHER AND WAS MODELLED AS RESIDUES LYS 112 TO ILE 119, BUT INTERPRETATION OF THIS REGION SHOULD BE DONE WITH CARE BECAUSE OF THE QUALITY OF THE ELECTRON DENSITY. SIMILARLY, IN SUBUNIT H, RESIDUES GLY 110 TO ASP121 WERE ORDERED AND VISIBLE, PROBABLY BECAUSE THIS SEGMENT MAKES CRYSTAL CONTACTS WITH SUBUNIT C AND F.