モノクロメーター: Si(111) / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.9 Å / 相対比: 1
反射
解像度: 2.5→20 Å / Num. all: 26252 / Num. obs: 26252 / % possible obs: 99.9 % / 冗長度: 5.9 % / Biso Wilson estimate: 49.8 Å2 / Rmerge(I) obs: 0.081 / Net I/σ(I): 11.6
反射 シェル
解像度: 2.5→2.54 Å / 冗長度: 6 % / Rmerge(I) obs: 0.487 / Mean I/σ(I) obs: 4.4 / Num. unique all: 1277 / % possible all: 1
-
解析
ソフトウェア
名称
バージョン
分類
BSS
データ収集
MOLREP
位相決定
REFMAC
5.5.0109
精密化
HKL-2000
データ削減
HKL-2000
データスケーリング
精密化
構造決定の手法: 分子置換 / 解像度: 2.5→19.93 Å / Cor.coef. Fo:Fc: 0.95 / Cor.coef. Fo:Fc free: 0.927 / SU B: 17.92 / SU ML: 0.176 / 交差検証法: THROUGHOUT / ESU R Free: 0.232 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.22943
1327
5.1 %
RANDOM
Rwork
0.19177
-
-
-
obs
0.19375
24770
99.35 %
-
all
-
26252
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 45.022 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.07 Å2
0.04 Å2
-0 Å2
2-
-
0.07 Å2
-0 Å2
3-
-
-
-0.11 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.5→19.93 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3675
0
51
147
3873
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.009
0.022
3804
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.297
1.981
5166
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.956
5
470
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
39.076
25.523
172
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.771
15
645
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.692
15
12
X-RAY DIFFRACTION
r_chiral_restr
0.089
0.2
576
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.021
2870
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.336
1.5
2354
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
0.694
2
3792
X-RAY DIFFRACTION
r_scbond_it
1.263
3
1450
X-RAY DIFFRACTION
r_scangle_it
2.173
4.5
1374
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.502→2.566 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.385
77
-
Rwork
0.252
1755
-
obs
-
-
97.19 %
精密化 TLS
手法: refined / Origin x: -1.262 Å / Origin y: -46.195 Å / Origin z: -9.803 Å