ソフトウェア 名称 バージョン 分類 HKL-3000データ収集 SHARP位相決定 REFMAC5.5.0109精密化 HKL-3000データ削減 SCALEPACKデータスケーリング
精密化 構造決定の手法 : 多波長異常分散 / 解像度 : 2.7→19.9 Å / Cor.coef. Fo :Fc : 0.934 / Cor.coef. Fo :Fc free : 0.904 / SU B : 35.145 / SU ML : 0.318 / 交差検証法 : THROUGHOUT / ESU R : 0.784 / ESU R Free : 0.344 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : RESIDUAL ONLYRfactor 反射数 %反射 Selection details Rfree 0.27221 1371 5 % RANDOM Rwork 0.24161 - - - obs 0.24315 27356 100 % -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.4 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 80.289 Å2 Baniso -1 Baniso -2 Baniso -3 1- -4.68 Å2 0 Å2 0 Å2 2- - -4.68 Å2 -0 Å2 3- - - 9.35 Å2
精密化ステップ サイクル : LAST / 解像度 : 2.7→19.9 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 5510 0 0 0 5510
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.019 0.022 5585 X-RAY DIFFRACTION r_bond_other_d0.001 0.02 3708 X-RAY DIFFRACTION r_angle_refined_deg1.669 1.96 7523 X-RAY DIFFRACTION r_angle_other_deg0.93 3 9193 X-RAY DIFFRACTION r_dihedral_angle_1_deg7.292 5 681 X-RAY DIFFRACTION r_dihedral_angle_2_deg41.276 27.526 291 X-RAY DIFFRACTION r_dihedral_angle_3_deg20.421 15 1083 X-RAY DIFFRACTION r_dihedral_angle_4_deg16.402 15 2 X-RAY DIFFRACTION r_chiral_restr0.089 0.2 857 X-RAY DIFFRACTION r_gen_planes_refined0.006 0.02 6171 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 995 X-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.658 1.5 3413 X-RAY DIFFRACTION r_mcbond_other0.113 1.5 1376 X-RAY DIFFRACTION r_mcangle_it1.233 2 5526 X-RAY DIFFRACTION r_scbond_it1.764 3 2172 X-RAY DIFFRACTION r_scangle_it2.897 4.5 1997 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 2.7→2.768 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.312 76 - Rwork 0.378 1519 - obs - - 100 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 6) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 9.945 3.6418 6.8614 6.2835 3.1136 10.7705 0.5535 -0.3582 -0.6899 1.1455 -0.1385 -0.1288 0.7142 -0.3218 -0.415 0.6327 0.0471 0.0064 0.5862 -0.0077 0.0544 -15.1894 26.2831 31.5572 2 3.1838 1.4587 1.1066 7.3406 0.7933 3.6069 -0.297 0.3333 -0.0828 0.02 0.2184 -0.5867 -0.1509 0.2729 0.0786 0.1821 0.0375 0.0432 0.345 -0.0317 0.1772 -5.9007 28.7459 20.3871 3 5.9532 1.841 1.6164 7.9651 2.8829 2.0644 -0.5818 1.1545 -0.1065 -0.1741 0.3936 -1.2124 -0.0977 0.6457 0.1881 0.3628 -0.183 0.1425 0.4985 0.1935 0.6328 13.5424 37.907 12.1712 4 9.1445 3.7191 -4.5803 3.6363 -2.4364 9.7921 0.4219 -0.58 1.1148 0.7093 0.0449 0.6008 -0.5928 0.3015 -0.4667 0.6109 0.0333 0.002 0.6262 -0.0715 0.1689 -37.5237 42.1495 28.1292 5 3.0516 0.4589 -0.8835 4.7646 0.3093 3.5463 -0.1621 -0.0515 0.167 0.3368 0.0484 0.4685 -0.0178 0.0267 0.1137 0.3916 0.0759 0.0379 0.5165 0.0366 0.068 -48.8863 37.5405 21.823 6 3.9282 1.3926 -0.9676 8.7674 -3.4603 3.7253 -0.271 0.552 -0.3425 0.4072 0.4829 1.9749 0.0481 -0.8128 -0.2118 0.1956 -0.0251 0.1591 0.3547 -0.0623 0.6876 -69.0938 26.8574 11.0776
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A17 - 107 2 X-RAY DIFFRACTION 2 A108 - 236 3 X-RAY DIFFRACTION 3 A237 - 367 4 X-RAY DIFFRACTION 4 B17 - 70 5 X-RAY DIFFRACTION 5 B71 - 237 6 X-RAY DIFFRACTION 6 B247 - 366