ソフトウェア 名称 バージョン 分類 SHELXD位相決定 SHARP位相決定 REFMAC5.5.0102精密化 XDSデータ削減 XSCALEデータスケーリング
精密化 構造決定の手法 : 単波長異常分散 / 解像度 : 2→29.19 Å / Cor.coef. Fo :Fc : 0.966 / Cor.coef. Fo :Fc free : 0.948 / SU B : 8.162 / SU ML : 0.102 / 交差検証法 : THROUGHOUT / ESU R Free : 0.148 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.20843 1854 4 % RANDOM Rwork 0.16222 - - - obs 0.16409 44481 100 % -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.4 Å / 溶媒モデル : BABINET MODEL WITH MASK原子変位パラメータ Biso mean : 31.326 Å2 Baniso -1 Baniso -2 Baniso -3 1- 0.82 Å2 0 Å2 -0 Å2 2- - 0.82 Å2 0 Å2 3- - - -1.64 Å2
精密化ステップ サイクル : LAST / 解像度 : 2→29.19 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 5034 0 20 414 5468
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.016 0.021 5176 X-RAY DIFFRACTION r_bond_other_d0.001 0.02 3387 X-RAY DIFFRACTION r_angle_refined_deg1.524 1.96 7066 X-RAY DIFFRACTION r_angle_other_deg0.934 3 8204 X-RAY DIFFRACTION r_dihedral_angle_1_deg6.014 5 686 X-RAY DIFFRACTION r_dihedral_angle_2_deg31.764 22.546 216 X-RAY DIFFRACTION r_dihedral_angle_3_deg14.568 15 738 X-RAY DIFFRACTION r_dihedral_angle_4_deg17.111 15 49 X-RAY DIFFRACTION r_chiral_restr0.096 0.2 800 X-RAY DIFFRACTION r_gen_planes_refined0.007 0.021 5973 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 1076 X-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it1.958 3.5 3396 X-RAY DIFFRACTION r_mcbond_other0.868 3.5 1408 X-RAY DIFFRACTION r_mcangle_it2.644 4 5374 X-RAY DIFFRACTION r_scbond_it2.957 5 1780 X-RAY DIFFRACTION r_scangle_it3.981 5 1690 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 2→2 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.268 135 - Rwork 0.207 3234 - obs - - 100 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 4) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 0.6441 0.1831 0.1384 0.8587 -0.1212 0.8668 0.0267 -0.0177 -0.0514 0.0105 0.0046 0.0094 0.0524 -0.0276 -0.0313 0.0058 -0.0003 -0.0002 0.0027 0.0046 0.0092 20.1096 7.1443 -26.3067 2 0.5069 0.0087 0.1107 0.9573 -0.1967 0.9759 0.0288 -0.0507 0.1434 0.1326 -0.0224 -0.0485 -0.1551 0.0701 -0.0064 0.0511 -0.0102 0.0193 0.0162 -0.0106 0.0565 28.7812 34.3386 -25.5729 3 4.6332 -17.9664 -7.9195 70.2948 31.1288 13.8178 0.0173 0.102 -0.1294 -0.054 -0.1829 0.4303 -0.0225 -0.0342 0.1656 0.1794 0.0366 0.0552 0.1491 0.0385 0.0787 15.9976 23.8281 -39.4373 4 0.2791 0.2165 -0.0629 0.8209 -0.1116 0.33 0.0135 0.0204 0.0113 -0.0132 0.0064 0.0344 -0.006 -0.0036 -0.0199 0.0359 0.0191 0.0119 0.0763 0.0062 0.0639 21.7807 18.8669 -31.1081
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A1 - 342 2 X-RAY DIFFRACTION 1 A401 - 402 3 X-RAY DIFFRACTION 2 B1 - 342 4 X-RAY DIFFRACTION 2 B401 - 402 5 X-RAY DIFFRACTION 3 A358 - 359 6 X-RAY DIFFRACTION 3 B358 - 359 7 X-RAY DIFFRACTION 4 A360 - 400 8 X-RAY DIFFRACTION 4 A403 - 588 9 X-RAY DIFFRACTION 4 B360 - 400 10 X-RAY DIFFRACTION 4 B403 - 548