解像度: 1.594→33.5 Å / Cor.coef. Fo:Fc: 0.956 / Cor.coef. Fo:Fc free: 0.94 / Occupancy max: 1 / Occupancy min: 0.25 / SU B: 4.256 / SU ML: 0.068 / SU R Cruickshank DPI: 0.1067 / 交差検証法: THROUGHOUT / ESU R: 0.106 / ESU R Free: 0.108 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.22535
837
5.1 %
RANDOM
Rwork
0.17861
-
-
-
obs
0.18098
15695
98.05 %
-
all
-
16532
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 15.736 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.47 Å2
0 Å2
0 Å2
2-
-
-0.99 Å2
0 Å2
3-
-
-
-0.48 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.594→33.5 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
988
0
0
95
1083
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.022
0.021
1316
X-RAY DIFFRACTION
r_bond_other_d
0.002
0.02
892
X-RAY DIFFRACTION
r_angle_refined_deg
1.989
1.934
1820
X-RAY DIFFRACTION
r_angle_other_deg
1.063
3
2171
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
7.295
5
185
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.648
23.75
72
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.777
15
219
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
19.301
15
15
X-RAY DIFFRACTION
r_chiral_restr
0.126
0.2
182
X-RAY DIFFRACTION
r_gen_planes_refined
0.012
0.021
1657
X-RAY DIFFRACTION
r_gen_planes_other
0.005
0.02
292
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.299
1.5
823
X-RAY DIFFRACTION
r_mcbond_other
0.404
1.5
327
X-RAY DIFFRACTION
r_mcangle_it
2.157
2
1355
X-RAY DIFFRACTION
r_scbond_it
3.044
3
493
X-RAY DIFFRACTION
r_scangle_it
4.779
4.5
465
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.594→1.635 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.335
53
-
Rwork
0.285
938
-
obs
-
-
79.6 %
精密化 TLS
手法: refined / Origin x: 5.52 Å / Origin y: 11.736 Å / Origin z: -1.067 Å