ソフトウェア 名称 バージョン 分類 RAMDAQデータ収集 SHARP位相決定 REFMAC5.5.0110精密化 XDSデータ削減 XSCALEデータスケーリング
精密化 構造決定の手法 : 単波長異常分散 / 解像度 : 2.4→19.59 Å / Cor.coef. Fo :Fc : 0.933 / Cor.coef. Fo :Fc free : 0.916 / SU B : 20.819 / SU ML : 0.216 / 交差検証法 : THROUGHOUT / ESU R Free : 0.276 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.26314 712 5 % RANDOM Rwork 0.2223 - - - obs 0.22432 13510 100 % -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.4 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 18.233 Å2 Baniso -1 Baniso -2 Baniso -3 1- 5.94 Å2 -0 Å2 -0 Å2 2- - -3.82 Å2 0 Å2 3- - - -2.12 Å2
精密化ステップ サイクル : LAST / 解像度 : 2.4→19.59 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 2446 0 6 39 2491
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.006 0.022 2492 X-RAY DIFFRACTION r_bond_other_dX-RAY DIFFRACTION r_angle_refined_deg0.989 1.993 3386 X-RAY DIFFRACTION r_angle_other_degX-RAY DIFFRACTION r_dihedral_angle_1_deg5.102 5 313 X-RAY DIFFRACTION r_dihedral_angle_2_deg35.729 26.538 104 X-RAY DIFFRACTION r_dihedral_angle_3_deg14.234 15 453 X-RAY DIFFRACTION r_dihedral_angle_4_deg5.95 15 6 X-RAY DIFFRACTION r_chiral_restr0.064 0.2 397 X-RAY DIFFRACTION r_gen_planes_refined0.003 0.021 1834 X-RAY DIFFRACTION r_gen_planes_otherX-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.535 4 1583 X-RAY DIFFRACTION r_mcbond_otherX-RAY DIFFRACTION r_mcangle_it0.888 4 2552 X-RAY DIFFRACTION r_scbond_it0.85 5 909 X-RAY DIFFRACTION r_scangle_it1.19 5 834 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 2.4→2.461 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.344 50 - Rwork 0.31 949 - obs - - 100 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 4) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 2.3605 -0.1435 1.4178 5.7033 0.8349 6.7248 0.0346 0.1489 -0.2325 -0.3374 -0.013 -0.2307 0.3531 0.0529 -0.0216 0.0489 0.0115 0.0211 0.0655 -0.0241 0.0476 -0.4725 -2.615 -24.0739 2 2.6503 1.6861 1.6666 5.2037 -0.1186 6.8449 0.1926 -0.1227 -0.0669 0.8738 -0.0549 -0.3256 0.0062 0.0669 -0.1377 0.1579 0.0127 -0.0695 0.0707 -0.0147 0.1636 7.8101 2.2892 5.2634 3 1.1952 0.0056 2.1813 0.9565 -1.4033 6.1459 0.1725 0.1728 -0.3285 0.111 0.2222 -0.0361 0.265 -0.0409 -0.3947 0.3176 0.0545 0.1429 0.1484 -0.1638 0.4036 2.5009 -1.6154 -20.365 4 0.2935 0.6949 0.5369 1.9745 0.298 4.1139 -0.045 0.0022 -0.0762 -0.1921 0.0414 -0.1762 -0.0371 -0.1818 0.0035 0.0403 0.0421 0.0177 0.0989 -0.0028 0.2365 1.9735 1.4686 -15.1423
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A20 - 178 2 X-RAY DIFFRACTION 2 B23 - 178 3 X-RAY DIFFRACTION 3 A1 - 6 4 X-RAY DIFFRACTION 3 B3 - 4 5 X-RAY DIFFRACTION 4 A3 - 16 6 X-RAY DIFFRACTION 4 A179 - 193 7 X-RAY DIFFRACTION 4 B15 8 X-RAY DIFFRACTION 4 B179 - 192