ソフトウェア 名称 バージョン 分類 PHASER位相決定 REFMAC5.5.0109精密化 XDSデータ削減 XSCALEデータスケーリング
精密化 構造決定の手法 : 分子置換開始モデル : PDB ENTRY 1QO5解像度 : 2→35.34 Å / Cor.coef. Fo :Fc : 0.964 / Cor.coef. Fo :Fc free : 0.951 / SU B : 5.361 / SU ML : 0.068 / 交差検証法 : THROUGHOUT / ESU R : 0.119 / ESU R Free : 0.113 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.19021 1749 4.9 % RANDOM Rwork 0.1624 - - - obs 0.16375 33882 99.58 % - all - 35792 - -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.4 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 29.39 Å2 Baniso -1 Baniso -2 Baniso -3 1- -0.54 Å2 0 Å2 0 Å2 2- - -0.98 Å2 0 Å2 3- - - 1.52 Å2
精密化ステップ サイクル : LAST / 解像度 : 2→35.34 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 2631 0 6 192 2829
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.015 0.022 2738 X-RAY DIFFRACTION r_bond_other_d0.001 0.02 1923 X-RAY DIFFRACTION r_angle_refined_deg1.395 1.984 3704 X-RAY DIFFRACTION r_angle_other_deg0.913 3 4702 X-RAY DIFFRACTION r_dihedral_angle_1_deg5.804 5 356 X-RAY DIFFRACTION r_dihedral_angle_2_deg37.385 24.052 116 X-RAY DIFFRACTION r_dihedral_angle_3_deg13.748 15 516 X-RAY DIFFRACTION r_dihedral_angle_4_deg22.125 15 18 X-RAY DIFFRACTION r_chiral_restr0.09 0.2 418 X-RAY DIFFRACTION r_gen_planes_refined0.006 0.02 3030 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 556 X-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.763 1.5 1691 X-RAY DIFFRACTION r_mcbond_other0.208 1.5 703 X-RAY DIFFRACTION r_mcangle_it1.371 2 2728 X-RAY DIFFRACTION r_scbond_it2.234 3 1047 X-RAY DIFFRACTION r_scangle_it3.645 4.5 965 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 2→2.052 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.285 129 - Rwork 0.214 2444 - obs - - 99.19 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 5) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 7.6286 3.3933 2.5794 6.9103 2.9276 7.2855 0.3083 -0.5179 -0.6935 0.8926 0.0509 -0.6383 0.5516 0.3266 -0.3592 0.2408 0.087 -0.0733 0.1206 0.0559 0.1611 -0.45 -26.876 3.888 2 2.6398 0.2055 -0.8225 1.5641 0.2977 1.9 -0.0207 -0.1292 -0.0402 0.1269 0.0765 0.2853 0.1236 -0.126 -0.0558 0.1392 -0.0865 0.0395 0.1051 0.0487 0.1342 -26.029 -24.359 4.48 3 0.9919 -0.1403 -0.0529 1.9921 -0.2057 1.8852 0.0323 -0.0581 0.0757 0.1116 0.0084 0.1009 -0.042 -0.0972 -0.0407 0.0346 -0.0176 0.0179 0.021 -0.003 0.0506 -12.689 -9.844 -3.556 4 1.4073 0.0798 -0.1363 1.0821 0.0657 1.0293 0.0194 0.175 -0.0092 -0.122 0.0123 0.1345 0.0987 -0.1358 -0.0317 0.0664 -0.0326 -0.0234 0.0536 0.0059 0.0675 -13.066 -20.47 -17.564 5 2.0792 -0.3408 -1.9024 1.423 0.927 3.2971 -0.0327 0.1006 -0.2648 0.1076 0.0233 0.2621 0.2626 -0.2633 0.0094 0.1557 -0.1394 -0.018 0.1562 0.053 0.2196 -29.764 -31.858 -6.453
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A3 - 15 2 X-RAY DIFFRACTION 2 A16 - 98 3 X-RAY DIFFRACTION 3 A99 - 183 4 X-RAY DIFFRACTION 4 A184 - 290 5 X-RAY DIFFRACTION 5 A291 - 338