解像度: 2.4→79.56 Å / Cor.coef. Fo:Fc: 0.957 / Cor.coef. Fo:Fc free: 0.933 / SU B: 16.113 / SU ML: 0.178 / 交差検証法: THROUGHOUT / ESU R Free: 0.23 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.24772
821
5.1 %
RANDOM
Rwork
0.20004
-
-
-
obs
0.2025
15419
99.61 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 68.261 Å2
Baniso -1
Baniso -2
Baniso -3
1-
3.74 Å2
0 Å2
0 Å2
2-
-
-2.25 Å2
0 Å2
3-
-
-
-1.49 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.4→79.56 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2203
0
0
29
2232
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.015
0.022
2244
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.419
1.98
3036
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.466
5
266
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
37.259
22.984
124
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.634
15
404
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
19.025
15
30
X-RAY DIFFRACTION
r_chiral_restr
0.093
0.2
328
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
1742
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.217
0.2
1089
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.311
0.2
1531
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.166
0.2
85
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.191
0.2
28
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.24
0.2
5
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.815
1.5
1381
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
3.044
2
2163
X-RAY DIFFRACTION
r_scbond_it
3.597
3
987
X-RAY DIFFRACTION
r_scangle_it
5.461
4.5
873
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.4→2.462 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.311
55
-
Rwork
0.243
1136
-
obs
-
-
99.83 %
精密化 TLS
手法: refined / Origin x: 37.064 Å / Origin y: 17.254 Å / Origin z: 1.377 Å