モノクロメーター: Si 111 / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
ID
波長 (Å)
相対比
1
1
1
2
0.97915
1
3
0.97932
1
4
0.96396
1
反射
解像度: 2.2→78.75 Å / Num. all: 16362 / Num. obs: 16362 / % possible obs: 98.6 % / 冗長度: 7 % / Rmerge(I) obs: 0.047 / Net I/σ(I): 43.9
反射 シェル
解像度: 2.2→2.28 Å / 冗長度: 6 % / Rmerge(I) obs: 0.27 / Mean I/σ(I) obs: 6.8 / % possible all: 88.4
-
解析
ソフトウェア
名称
バージョン
分類
Blu-Ice
5
データ収集
SHARP
位相決定
REFMAC
5.5.0088
精密化
DENZO
データ削減
HKL-2000
データスケーリング
精密化
構造決定の手法: 多波長異常分散 / 解像度: 2.2→78.75 Å / Cor.coef. Fo:Fc: 0.931 / Cor.coef. Fo:Fc free: 0.902 / SU B: 10.001 / SU ML: 0.12 / 交差検証法: THROUGHOUT / ESU R: 0.261 / ESU R Free: 0.216 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.25972
827
5.1 %
RANDOM
Rwork
0.21157
-
-
-
obs
0.21394
15494
98.94 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 38.527 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.26 Å2
0 Å2
0 Å2
2-
-
2.2 Å2
0 Å2
3-
-
-
-0.94 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.2→78.75 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1971
0
0
122
2093
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.01
0.022
2046
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.188
1.962
2775
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.26
5
257
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.27
22.826
92
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
16.877
15
350
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
17.464
15
16
X-RAY DIFFRACTION
r_chiral_restr
0.082
0.2
309
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.021
1553
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.363
1.5
1256
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
2.345
2
2036
X-RAY DIFFRACTION
r_scbond_it
3.046
3
790
X-RAY DIFFRACTION
r_scangle_it
4.751
4.5
735
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.2→2.257 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.237
59
-
Rwork
0.187
1029
-
obs
-
-
90.74 %
精密化 TLS
手法: refined / Origin x: 30.7385 Å / Origin y: 25.9564 Å / Origin z: 28.4194 Å