構造決定の手法: 単波長異常分散 / 解像度: 1.74→26.06 Å / Cor.coef. Fo:Fc: 0.955 / Cor.coef. Fo:Fc free: 0.945 / SU B: 5.698 / SU ML: 0.082 / 交差検証法: THROUGHOUT / ESU R: 0.11 / ESU R Free: 0.105 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.23305
819
5 %
RANDOM
Rwork
0.21006
-
-
-
obs
0.21118
15435
98.35 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 28.381 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.11 Å2
0 Å2
0 Å2
2-
-
-0.06 Å2
0 Å2
3-
-
-
-0.05 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.74→26.06 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
906
0
0
82
988
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.01
0.022
914
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.169
1.996
1230
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
4.685
5
114
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.872
27.5
44
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.679
15
183
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
12.227
15
2
X-RAY DIFFRACTION
r_chiral_restr
0.081
0.2
146
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.02
665
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.682
1.5
572
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.342
2
920
X-RAY DIFFRACTION
r_scbond_it
2.399
3
342
X-RAY DIFFRACTION
r_scangle_it
4.179
4.5
310
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.737→1.782 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.414
55
-
Rwork
0.341
997
-
obs
-
-
87.52 %
精密化 TLS
手法: refined / Origin x: 11.568 Å / Origin y: 14.602 Å / Origin z: -18.096 Å