解像度: 1.65→19.98 Å / Cor.coef. Fo:Fc: 0.972 / SU B: 1.107 / SU ML: 0.039 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / ESU R: 0.076 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.146
4409
5 %
RANDOM
Rwork
0.15503
-
-
-
obs
0.15503
87941
99.91 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 21.608 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.31 Å2
-0.15 Å2
0 Å2
2-
-
-0.31 Å2
0 Å2
3-
-
-
0.46 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.65→19.98 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4384
0
53
778
5215
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.007
0.022
5079
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.117
1.962
6983
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.018
5
675
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.276
23.656
227
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
11.368
15
769
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
12.921
15
40
X-RAY DIFFRACTION
r_chiral_restr
0.076
0.2
770
X-RAY DIFFRACTION
r_gen_planes_refined
0.004
0.02
4036
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.217
0.2
2437
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.304
0.2
3491
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.098
0.2
701
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.161
0.2
67
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.123
0.2
66
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.461
1.5
3273
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
0.782
2
5224
X-RAY DIFFRACTION
r_scbond_it
1.212
3
2044
X-RAY DIFFRACTION
r_scangle_it
1.945
4.5
1759
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.65→1.693 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rwork
0.178
6321
-
Rfree
-
0
-
obs
-
-
99.56 %
精密化 TLS
手法: refined / Origin x: 15.808 Å / Origin y: 64.846 Å / Origin z: -0.254 Å