THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS REMOVED WITH ...THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS REMOVED WITH TEV PROTEASE LEAVING ONLY A GLYCINE (0) FOLLOWED BY THE TARGET SEQUENCE. DNA SEQUENCING OF THE CLONED CONSTRUCT SHOWS A LEUCINE AT POSITION 94 INSTEAD OF A PROLINE. THE LEUCINE AT POSITION 94 IS SUPPORTED BY THE ELECTRON DENSITY.
解像度: 2.1→77.85 Å / Num. obs: 13583 / % possible obs: 87.2 % / 冗長度: 3.1 % / Biso Wilson estimate: 31.24 Å2 / Rmerge(I) obs: 0.088 / Rsym value: 0.088 / Net I/σ(I): 5.6
反射 シェル
Diffraction-ID: 1
解像度 (Å)
冗長度 (%)
Rmerge(I) obs
Mean I/σ(I) obs
Num. measured all
Num. unique all
Rsym value
% possible all
2.1-2.21
3.1
0.475
1.5
6800
2201
0.475
97.9
2.21-2.35
3.1
0.456
0.6
5024
1645
0.456
77.7
2.35-2.51
3.1
0.276
2.5
6084
1964
0.276
98.3
2.51-2.71
3.1
0.216
2.8
4487
1465
0.216
78.4
2.71-2.97
3.1
0.136
5
5218
1709
0.136
98.4
2.97-3.32
3.1
0.088
7.5
4705
1536
0.088
98.8
3.32-3.83
3
0.066
9.6
2170
715
0.066
51.2
3.83-4.7
3
0.039
15.7
2728
900
0.039
76
4.7-6.64
3
0.041
15.8
2756
924
0.041
98.8
6.64-77.85
2.8
0.042
12.7
1467
524
0.042
97.4
-
位相決定
位相決定
手法: 多波長異常分散
-
解析
ソフトウェア
名称
バージョン
分類
NB
REFMAC
5.2.0019
精密化
PHENIX
精密化
SHELX
位相決定
MolProbity
3beta29
モデル構築
SCALA
データスケーリング
PDB_EXTRACT
3.004
データ抽出
MOSFLM
データ削減
SHELXD
位相決定
autoSHARP
位相決定
精密化
構造決定の手法: 多波長異常分散 / 解像度: 2.1→77.85 Å / Cor.coef. Fo:Fc: 0.941 / Cor.coef. Fo:Fc free: 0.929 / SU B: 12.389 / SU ML: 0.168 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.269 / ESU R Free: 0.219 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: 1. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. 2. ATOM RECORD CONTAINS RESIDUAL B FACTORS ONLY. 3. A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPORATION DURING PROTEIN ...詳細: 1. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. 2. ATOM RECORD CONTAINS RESIDUAL B FACTORS ONLY. 3. A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPORATION DURING PROTEIN EXPRESSION. THE OCCUPANCY OF THE SE ATOMS IN THE MSE RESIDUES WAS REDUCED TO 0.75 FOR THE REDUCED SCATTERING POWER DUE TO PARTIAL S-MET INCORPORATION. 4. CHLORIDE AND IMIDAZOLE WERE MODELED BASED ON CRYSTALLIZATION CONDITIONS. 5. THERE IS UNMODELED ELECTRON DENSITY NEAR RESIDUE A169, WHICH COULD BE PART OF THE MISSING N-TERMINUS. 6. REFLECTIONS IN THE FOLLOWING RESOLUTION RANGES CORRESPONDING TO ICE RINGS WERE OMITTED DURING INTEGRATION OF THE DIFFRACTION DATA: 3.97-3.82 A, 3.72-3.61 A, 3.50-3.39 A, 2.69-2.64 A AND 2.26-2.24 A. IN ADDITION, 14 UNUSUALLY STRONG REFLECTIONS WERE ALSO OMITTED FROM THE DATA USED FOR FINAL REFINEMENT. 7. THE NOMINAL RESOLUTION IS 2.25 A WITH 2563 OBSERVED REFLECTIONS BETWEEN 2.25-2.10 (88.8% COMPLETE FOR THIS SHELL) INCLUDED IN THE REFINEMENT.
Rfactor
反射数
%反射
Selection details
Rfree
0.267
660
4.9 %
RANDOM
Rwork
0.223
-
-
-
obs
0.225
13555
86.47 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 29.623 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.44 Å2
0 Å2
-0.52 Å2
2-
-
3.7 Å2
0 Å2
3-
-
-
-2.72 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.1→77.85 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1623
0
7
95
1725
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.015
0.022
1683
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1116
X-RAY DIFFRACTION
r_angle_refined_deg
1.535
1.954
2294
X-RAY DIFFRACTION
r_angle_other_deg
0.956
3
2718
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
3.139
5
205
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
32.706
24.578
83
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
11.499
15
277
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
20.332
15
8
X-RAY DIFFRACTION
r_chiral_restr
0.095
0.2
251
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
1878
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
355
X-RAY DIFFRACTION
r_nbd_refined
0.202
0.2
381
X-RAY DIFFRACTION
r_nbd_other
0.185
0.2
1120
X-RAY DIFFRACTION
r_nbtor_refined
0.185
0.2
840
X-RAY DIFFRACTION
r_nbtor_other
0.087
0.2
784
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.209
0.2
76
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.342
0.2
8
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.213
0.2
29
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.206
0.2
5
X-RAY DIFFRACTION
r_mcbond_it
1.139
2
1137
X-RAY DIFFRACTION
r_mcbond_other
0.238
2
400
X-RAY DIFFRACTION
r_mcangle_it
1.63
3
1637
X-RAY DIFFRACTION
r_scbond_it
0.92
2
763
X-RAY DIFFRACTION
r_scangle_it
1.325
3
654
LS精密化 シェル
解像度: 2.1→2.155 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.275
44
-
Rwork
0.286
1059
-
all
-
1103
-
obs
-
-
96.33 %
精密化 TLS
手法: refined / Origin x: -9.3437 Å / Origin y: 7.9975 Å / Origin z: 20.742 Å