THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS REMOVED WITH ...THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS REMOVED WITH TEV PROTEASE LEAVING ONLY A GLYCINE (0) FOLLOWED BY THE TARGET SEQUENCE.
解像度: 1.95→35.267 Å / Num. obs: 15859 / % possible obs: 91.6 % / Observed criterion σ(I): -3 / Biso Wilson estimate: 24.87 Å2 / Rmerge(I) obs: 0.055 / Net I/σ(I): 19.95
反射 シェル
解像度 (Å)
Rmerge(I) obs
Mean I/σ(I) obs
Num. measured obs
Num. unique obs
Diffraction-ID
% possible all
1.95-2.02
0.263
7.2
10958
1715
1
99.9
2.02-2.1
0.184
10.3
11201
1682
1
100
2.1-2.2
0.139
12.5
11510
1774
1
99.4
2.2-2.31
0.116
11
1258
332
1
20.5
2.31-2.46
0.089
17.8
12123
1782
1
100
2.46-2.65
0.072
20.3
11729
1716
1
100
2.65-2.91
0.061
23.9
11487
1687
1
100
2.91-3.33
0.05
27.9
11750
1732
1
100
3.33-4.19
0.045
29.7
10501
1618
1
92.2
4.19-35.267
0.038
31.6
11707
1822
1
99.3
-
位相決定
位相決定
手法: 多波長異常分散
-
解析
ソフトウェア
名称
バージョン
分類
NB
REFMAC
5.4.0067
精密化
PHENIX
精密化
SHELX
位相決定
MolProbity
3beta29
モデル構築
XSCALE
データスケーリング
PDB_EXTRACT
3
データ抽出
MAR345
CCD
データ収集
XDS
データ削減
SHELXD
位相決定
autoSHARP
位相決定
精密化
構造決定の手法: 多波長異常分散 / 解像度: 1.95→35.267 Å / Cor.coef. Fo:Fc: 0.96 / Cor.coef. Fo:Fc free: 0.933 / SU B: 6.184 / SU ML: 0.098 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.172 / ESU R Free: 0.159 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES 詳細: 1. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. 2. A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPORATION DURING PROTEIN EXPRESSION. THE OCCUPANCY OF THE SE ATOMS IN THE ...詳細: 1. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. 2. A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPORATION DURING PROTEIN EXPRESSION. THE OCCUPANCY OF THE SE ATOMS IN THE MSE RESIDUES WAS REDUCED TO 0.75 FOR THE REDUCED SCATTERING POWER DUE TO PARTIAL S-MET INCORPORATION. 3. ATOM RECORD CONTAINS RESIDUAL B FACTORS ONLY. 4. THE REFLECTIONS WITHIN RESOLUTION RANGES 3.70-3.64 AND 2.3-2.2 ANGSTROM WERE EXCLUDED DURING INTEGRATION AND SUBSEQUENT STEPS DUE TO THE PRESENCE OF ICE RINGS.
Rfactor
反射数
%反射
Selection details
Rfree
0.218
792
5 %
RANDOM
Rwork
0.165
-
-
-
obs
0.167
15859
91.63 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 19.647 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.15 Å2
-0.07 Å2
0 Å2
2-
-
-0.15 Å2
0 Å2
3-
-
-
0.22 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.95→35.267 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1571
0
0
288
1859
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.014
0.022
1676
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1163
X-RAY DIFFRACTION
r_angle_refined_deg
1.41
1.978
2297
X-RAY DIFFRACTION
r_angle_other_deg
1.582
3
2827
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.398
5
225
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
32.374
23.125
80
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.361
15
272
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
17.496
15
19
X-RAY DIFFRACTION
r_chiral_restr
0.085
0.2
255
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.021
1923
X-RAY DIFFRACTION
r_gen_planes_other
0.003
0.02
344
X-RAY DIFFRACTION
r_mcbond_it
1.808
3
1058
X-RAY DIFFRACTION
r_mcbond_other
0.502
3
424
X-RAY DIFFRACTION
r_mcangle_it
2.979
5
1696
X-RAY DIFFRACTION
r_scbond_it
4.616
8
618
X-RAY DIFFRACTION
r_scangle_it
6.9
11
591
LS精密化 シェル
解像度: 1.95→2.001 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.249
68
-
Rwork
0.187
1182
-
all
-
1250
-
obs
-
-
99.76 %
精密化 TLS
手法: refined / Origin x: 22.5935 Å / Origin y: 12.4151 Å / Origin z: 38.2847 Å