ENGINEERED RESIDUE IN CHAIN A, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN A, PHE 336 TO MET ...ENGINEERED RESIDUE IN CHAIN A, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN A, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN A, ASN 338 TO GLN ENGINEERED RESIDUE IN CHAIN A, ILE 341 TO VAL ENGINEERED RESIDUE IN CHAIN A, LEU 409 TO PHE ENGINEERED RESIDUE IN CHAIN C, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN C, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN C, ASN 338 TO GLN ENGINEERED RESIDUE IN CHAIN C, ILE 341 TO VAL ENGINEERED RESIDUE IN CHAIN C, LEU 409 TO PHE ENGINEERED RESIDUE IN CHAIN E, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN E, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN E, ASN 338 TO GLN ENGINEERED RESIDUE IN CHAIN E, ILE 341 TO VAL ENGINEERED RESIDUE IN CHAIN E, LEU 409 TO PHE ENGINEERED RESIDUE IN CHAIN G, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN G, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN G, ASN 338 TO GLN ENGINEERED RESIDUE IN CHAIN G, ILE 341 TO VAL ENGINEERED RESIDUE IN CHAIN G, LEU 409 TO PHE ENGINEERED RESIDUE IN CHAIN I, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN I, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN I, ASN 338 TO GLN ENGINEERED RESIDUE IN CHAIN I, ILE 341 TO VAL ENGINEERED RESIDUE IN CHAIN I, LEU 409 TO PHE ENGINEERED RESIDUE IN CHAIN K, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN K, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN K, ASN 338 TO GLN ENGINEERED RESIDUE IN CHAIN K, ILE 341 TO VAL ENGINEERED RESIDUE IN CHAIN K, LEU 409 TO PHE
解像度: 2.15→138.68 Å / Cor.coef. Fo:Fc: 0.953 / Cor.coef. Fo:Fc free: 0.939 / SU B: 12.747 / SU ML: 0.168 / 交差検証法: THROUGHOUT / ESU R: 0.309 / ESU R Free: 0.21 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS.
Rfactor
反射数
%反射
Selection details
Rfree
0.23312
9876
5 %
RANDOM
Rwork
0.2036
-
-
-
obs
0.20509
186884
92.94 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK