ENGINEERED RESIDUE IN CHAIN A, LEU 80 TO MET ENGINEERED RESIDUE IN CHAIN B, LEU 80 TO MET ...ENGINEERED RESIDUE IN CHAIN A, LEU 80 TO MET ENGINEERED RESIDUE IN CHAIN B, LEU 80 TO MET ENGINEERED RESIDUE IN CHAIN C, LEU 80 TO MET ENGINEERED RESIDUE IN CHAIN D, LEU 80 TO MET
非ポリマーの詳細
PEG 400 (PG4): PEG 3350 IN CRYSTALLISATION CONDITIONS MODELLED AS PEG 400
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実験情報
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実験
実験
手法: X線回折 / 使用した結晶の数: 1
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試料調製
結晶
マシュー密度: 2.32 Å3/Da / 溶媒含有率: 47 % / 解説: RD1, RD2 USED AS SEPARATE SEARCH MODELS
解像度: 2.89→47.14 Å / SU ML: 0.46 / σ(F): 1.34 / 位相誤差: 30.39 / 立体化学のターゲット値: ML 詳細: FOR ALL CHAINS IN THE ASYMMETRIC UNIT ELECTRON DENSITY FOR AMINO ACIDS ALA 201 TO VAL 209 IS DISORDERED. THE MODEL IN THESE REGIONS SHOULD BE TREATED WITH CAUTION.
Rfactor
反射数
%反射
Rfree
0.287
1057
5.2 %
Rwork
0.242
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obs
0.244
20450
93.7 %
溶媒の処理
減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL / Bsol: 36.22 Å2 / ksol: 0.35 e/Å3