ENGINEERED RESIDUE IN CHAIN A, HIS 99 TO ALA ENGINEERED RESIDUE IN CHAIN A, HIS 101 TO ALA ...ENGINEERED RESIDUE IN CHAIN A, HIS 99 TO ALA ENGINEERED RESIDUE IN CHAIN A, HIS 101 TO ALA ENGINEERED RESIDUE IN CHAIN A, CYS 107 TO SER ENGINEERED RESIDUE IN CHAIN B, HIS 99 TO ALA ENGINEERED RESIDUE IN CHAIN B, HIS 101 TO ALA ENGINEERED RESIDUE IN CHAIN B, CYS 107 TO SER
解像度: 1.9→47.789 Å / SU ML: 0.03 / σ(F): 0.87 / 位相誤差: 20.08 / 立体化学のターゲット値: ML 詳細: THE STRUCTURE WAS REFINED USING FOBS+ AND FOBS- AND NOT FOBS TO VERIFY THE PRESENCE OF METAL IONS
Rfactor
反射数
%反射
Rfree
0.2189
2572
5.1 %
Rwork
0.1877
-
-
obs
0.1893
50640
99.95 %
溶媒の処理
減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL / Bsol: 67.583 Å2 / ksol: 0.377 e/Å3