ENGINEERED RESIDUE IN CHAIN A, GLU 153 TO ALA ENGINEERED RESIDUE IN CHAIN A, GLU 154 TO ALA ...ENGINEERED RESIDUE IN CHAIN A, GLU 153 TO ALA ENGINEERED RESIDUE IN CHAIN A, GLU 154 TO ALA ENGINEERED RESIDUE IN CHAIN B, GLU 153 TO ALA ENGINEERED RESIDUE IN CHAIN B, GLU 154 TO ALA ENGINEERED RESIDUE IN CHAIN C, GLU 153 TO ALA ENGINEERED RESIDUE IN CHAIN C, GLU 154 TO ALA ENGINEERED RESIDUE IN CHAIN D, GLU 153 TO ALA ENGINEERED RESIDUE IN CHAIN D, GLU 154 TO ALA
非ポリマーの詳細
OXYGEN MOLECULE (OXY): THE ELECTRON DENSITY SHOWS A PEAK THAT HAS BEEN TENTATIVELY ASSIGNED TO A ...OXYGEN MOLECULE (OXY): THE ELECTRON DENSITY SHOWS A PEAK THAT HAS BEEN TENTATIVELY ASSIGNED TO A DIOXYGEN MOLECULE. WE CANNOT EXCLUDE THAT, INSTEAD OF DIOXYGEN, A SUPEROXIDE MOLECULE OR A MONOATOMIC CATION IS PRESENT.
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実験情報
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実験
実験
手法: X線回折 / 使用した結晶の数: 1
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試料調製
結晶
マシュー密度: 4.28 Å3/Da / 溶媒含有率: 60 % / 解説: NONE
結晶化
pH: 7.5 / 詳細: 20% W/V PEG4000, 100 MM NA-HEPES, 1 MM NADP PH 7.5
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データ収集
回折
平均測定温度: 100 K
放射光源
由来: シンクロトロン / サイト: ESRF / ビームライン: ID14-1 / 波長: 1
放射
プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1 Å / 相対比: 1
反射
解像度: 2.8→30 Å / Num. obs: 86940 / % possible obs: 99.7 % / Observed criterion σ(I): 0 / 冗長度: 3.2 % / Rmerge(I) obs: 0.08 / Net I/σ(I): 13.1
反射 シェル
解像度: 2.8→2.9 Å / 冗長度: 3.1 % / Rmerge(I) obs: 0.43 / Mean I/σ(I) obs: 2.1 / % possible all: 100
解像度: 2.8→29.72 Å / Cor.coef. Fo:Fc: 0.924 / Cor.coef. Fo:Fc free: 0.911 / SU B: 26.134 / SU ML: 0.231 / 交差検証法: THROUGHOUT / ESU R: 0.527 / ESU R Free: 0.294 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS.
Rfactor
反射数
%反射
Selection details
Rfree
0.242
4332
5 %
RANDOM
Rwork
0.226
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obs
0.226
82568
99.6 %
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溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK