ソフトウェア 名称 バージョン 分類 REFMAC5.2.0019精密化 SBC-Collectデータ収集 HKL-2000データ削減 HKL-2000データスケーリング HKL-3000位相決定 SHELXEモデル構築 SOLVE位相決定 RESOLVE位相決定 ARP/wARPモデル構築
精密化 構造決定の手法 : 単波長異常分散 / 解像度 : 1.9→42.41 Å / Cor.coef. Fo :Fc : 0.959 / Cor.coef. Fo :Fc free : 0.953 / SU B : 5.163 / SU ML : 0.082 / TLS residual ADP flag : LIKELY RESIDUAL / 交差検証法 : THROUGHOUT / σ(F) : 0 / σ(I) : 0 / ESU R : 0.11 / ESU R Free : 0.104 立体化学のターゲット値 : MAXIMUM LIKELIHOOD WITH PHASES詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.19898 2699 5.1 % RANDOM Rwork 0.17768 - - - all 0.17878 50676 - - obs 0.17878 50367 99.39 % -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 19.854 Å2 Baniso -1 Baniso -2 Baniso -3 1- 0.4 Å2 0 Å2 0 Å2 2- - 0.4 Å2 0 Å2 3- - - -0.8 Å2
Refine analyze Free Obs Luzzati coordinate error 0.04 Å 0.032 Å Luzzati d res low - 6 Å Luzzati sigma a 0.5 Å 0.31 Å
精密化ステップ サイクル : LAST / 解像度 : 1.9→42.41 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 3186 0 0 476 3662
拘束条件 大きな表を表示 (5 x 24) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.013 0.022 3237 X-RAY DIFFRACTION r_bond_other_d0.002 0.02 2118 X-RAY DIFFRACTION r_angle_refined_deg1.428 1.963 4401 X-RAY DIFFRACTION r_angle_other_deg0.934 3 5160 X-RAY DIFFRACTION r_dihedral_angle_1_deg7.361 5 424 X-RAY DIFFRACTION r_dihedral_angle_2_deg30.037 23.603 136 X-RAY DIFFRACTION r_dihedral_angle_3_deg15.402 15 515 X-RAY DIFFRACTION r_dihedral_angle_4_deg24.372 15 27 X-RAY DIFFRACTION r_chiral_restr0.08 0.2 520 X-RAY DIFFRACTION r_gen_planes_refined0.005 0.02 3668 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 649 X-RAY DIFFRACTION r_nbd_refined0.212 0.2 676 X-RAY DIFFRACTION r_nbd_other0.201 0.2 2355 X-RAY DIFFRACTION r_nbtor_refined0.169 0.2 1526 X-RAY DIFFRACTION r_nbtor_other0.089 0.2 1770 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.204 0.2 377 X-RAY DIFFRACTION r_symmetry_vdw_refined0.122 0.2 23 X-RAY DIFFRACTION r_symmetry_vdw_other0.246 0.2 63 X-RAY DIFFRACTION r_symmetry_hbond_refined0.217 0.2 48 X-RAY DIFFRACTION r_mcbond_it0.942 1.5 2677 X-RAY DIFFRACTION r_mcbond_other0.177 1.5 869 X-RAY DIFFRACTION r_mcangle_it1.083 2 3347 X-RAY DIFFRACTION r_scbond_it2.274 3 1260 X-RAY DIFFRACTION r_scangle_it3.24 4.5 1054
LS精密化 シェル 解像度 : 1.9→1.95 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.285 200 - Rwork 0.242 3494 - obs - 3494 95.5 %
精密化 TLS 手法 : refined / Origin x : 25.517 Å / Origin y : 0.882 Å / Origin z : 0.096 Å11 12 13 21 22 23 31 32 33 T -0.1514 Å2 -0.0168 Å2 -0.0077 Å2 - 0.2897 Å2 -0.0072 Å2 - - -0.1084 Å2 L 1.0356 °2 -0.2399 °2 -0.3884 °2 - 0.4082 °2 0.1412 °2 - - 1.9165 °2 S -0.0033 Å ° -0.3324 Å ° 0.0036 Å ° 0.0019 Å ° 0.0745 Å ° -0.0567 Å ° -0.0243 Å ° 0.7555 Å ° -0.0712 Å °
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Label asym-ID Auth seq-ID Label seq-ID 1 X-RAY DIFFRACTION 1 AA1 - 50 1 - 50 2 X-RAY DIFFRACTION 1 AA51 - 100 51 - 100 3 X-RAY DIFFRACTION 1 AA101 - 142 101 - 142 4 X-RAY DIFFRACTION 1 BB1 - 50 1 - 50 5 X-RAY DIFFRACTION 1 BB51 - 100 51 - 100 6 X-RAY DIFFRACTION 1 BB101 - 143 101 - 143 7 X-RAY DIFFRACTION 1 CC1 - 50 1 - 50 8 X-RAY DIFFRACTION 1 CC51 - 100 51 - 100 9 X-RAY DIFFRACTION 1 CC101 - 142 101 - 142