SEQUENCE THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS ...SEQUENCE THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS REMOVED WITH TEV PROTEASE LEAVING ONLY A GLYCINE (0) FOLLOWED BY THE TARGET SEQUENCE.
解像度: 1.6→29.05 Å / Num. obs: 56989 / % possible obs: 99.7 % / 冗長度: 14.16 % / Biso Wilson estimate: 24.466 Å2 / Rmerge(I) obs: 0.097 / Net I/σ(I): 12.9
反射 シェル
Diffraction-ID: 1
解像度 (Å)
最高解像度 (Å)
% possible obs (%)
Rmerge(I) obs
Mean I/σ(I) obs
Num. measured obs
Num. unique obs
% possible all
1.6-1.66
90.4
0.884
2.3
70713
10181
98.7
1.66-1.72
94
0.717
3.1
68850
9135
1.72-1.8
95.2
0.567
4
79720
10539
1.8-1.9
96.4
0.41
5.3
82565
10884
1.9-2.02
97.5
0.276
7.7
80025
10522
2.02-2.17
98.4
0.193
10.3
77451
10151
2.17-2.39
99
0.126
14.7
82258
10740
2.39-2.73
99.5
0.094
18.4
81427
10609
2.73
99.8
0.06
26
82473
10787
-
位相決定
位相決定
手法: 多波長異常分散
-
解析
ソフトウェア
名称
バージョン
分類
NB
REFMAC
5.2.0005
精密化
XSCALE
データスケーリング
PDB_EXTRACT
1.701
データ抽出
XDS
データ削減
SOLVE
位相決定
精密化
構造決定の手法: 多波長異常分散 / 解像度: 1.6→28.01 Å / Cor.coef. Fo:Fc: 0.969 / Cor.coef. Fo:Fc free: 0.96 / SU B: 2.838 / SU ML: 0.05 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.07 / ESU R Free: 0.072 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES 詳細: 1. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS 2. A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPOR DURING PROTEIN EXPRESSION. THE OCCUPANCY OF THE SE ATOMS IN THE M ...詳細: 1. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS 2. A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPOR DURING PROTEIN EXPRESSION. THE OCCUPANCY OF THE SE ATOMS IN THE M RESIDUES WAS REDUCED TO 0.7 TO ACCOUNT FOR THE REDUCED SCATTERING DUE TO PARTIAL S-MET INCORPORATION. 3. THE ELECTRON DENISTY FOR RESIDUES 246-247 WAS DIFFICULT TO INTERPRET AND MAY BE POORLY MODELLED. 4. UNL (UNKNOWN LIGAND) WAS MODELLED INTO EXTRA DENSITY NEAR RESIDUES 247-249. THIS REGION MAY DENOTE THE PROTEIN ACTIVE SITE. 5. ADDITIONAL DENSITY NEAR UNL WAS INTERPRETED TO BE WATER. 6. ATOM RECORD CONTAINS RESIDUAL B FACTORS ONLY. THE MEAN B VALUE INCLUDING THE INDIVIDUAL AND TLS COMPONENTS IS 20.7 A**2.
Rfactor
反射数
%反射
Selection details
Rfree
0.19
2886
5.1 %
RANDOM
Rwork
0.164
-
-
-
all
0.165
-
-
-
obs
0.16542
56989
99.86 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 13.932 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.56 Å2
0.28 Å2
0 Å2
2-
-
0.56 Å2
0 Å2
3-
-
-
-0.84 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.6→28.01 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2388
0
37
319
2744
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.018
0.022
2660
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
2374
X-RAY DIFFRACTION
r_angle_refined_deg
0.957
1.952
3637
X-RAY DIFFRACTION
r_angle_other_deg
0.571
3
5552
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.99
5
367
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
29.633
24.436
133
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.043
15
439
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
10.544
15
15
X-RAY DIFFRACTION
r_chiral_restr
0.06
0.2
393
X-RAY DIFFRACTION
r_gen_planes_refined
0.009
0.02
3089
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
576
X-RAY DIFFRACTION
r_nbd_refined
0.22
0.2
536
X-RAY DIFFRACTION
r_nbd_other
0.202
0.2
2345
X-RAY DIFFRACTION
r_nbtor_refined
0.191
0.2
1302
X-RAY DIFFRACTION
r_nbtor_other
0.089
0.2
1435
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.162
0.2
250
X-RAY DIFFRACTION
r_xyhbond_nbd_other
0.143
0.2
1
X-RAY DIFFRACTION
r_metal_ion_refined
0.05
0.2
4
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.273
0.2
21
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.246
0.2
71
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.141
0.2
17
X-RAY DIFFRACTION
r_mcbond_it
0.408
1
1629
X-RAY DIFFRACTION
r_mcbond_other
0.025
1
668
X-RAY DIFFRACTION
r_mcangle_it
1.017
3
2652
X-RAY DIFFRACTION
r_scbond_it
2.634
5
1051
X-RAY DIFFRACTION
r_scangle_it
4.138
8
955
LS精密化 シェル
解像度: 1.6→1.641 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.276
218
-
Rwork
0.243
3916
-
obs
-
4134
99.86 %
精密化 TLS
手法: refined / Refine-ID: X-RAY DIFFRACTION
ID
L11 (°2)
L12 (°2)
L13 (°2)
L22 (°2)
L23 (°2)
L33 (°2)
S11 (Å °)
S12 (Å °)
S13 (Å °)
S21 (Å °)
S22 (Å °)
S23 (Å °)
S31 (Å °)
S32 (Å °)
S33 (Å °)
T11 (Å2)
T12 (Å2)
T13 (Å2)
T22 (Å2)
T23 (Å2)
T33 (Å2)
Origin x (Å)
Origin y (Å)
Origin z (Å)
1
10.1592
-0.4698
-0.1743
6.9114
3.4814
10.9094
-0.146
0.0416
-0.5295
0.2411
-0.0796
0.2142
0.5801
-0.2384
0.2255
0.0667
-0.0036
0.0058
0.022
0.0051
0.0124
55.737
44.783
6.313
2
0.8027
0.1766
-0.1331
0.2684
-0.1045
0.5636
-0.0056
0.0692
0.0542
-0.0133
0.0253
0.0069
-0.0504
0.0015
-0.0197
0.0362
-0.0012
0.0049
0.0063
0.0107
-0.0207
51.767
54.259
15.208
3
0.7203
-0.29
-0.1021
0.2897
0.0841
0.4341
0.0244
0.0888
0.0047
-0.0165
0.0098
0.0332
-0.0197
-0.145
-0.0343
0.0427
0.0033
-0.0074
0.0494
0.0275
-0.0033
39.928
56.945
13.344
4
20.0139
8.7237
4.4893
11.1095
2.2973
10.1892
0.0168
1.0173
-0.7085
-0.4049
0.3467
-0.6025
0.005
0.5338
-0.3635
0.0428
0.0043
0.0295
0.0857
-0.0184
-0.034
67.652
52.393
1.449
精密化 TLSグループ
Refine-ID: X-RAY DIFFRACTION / Selection: ALL / Auth asym-ID: A / Label asym-ID: A