解像度: 1.5→44.42 Å / Cor.coef. Fo:Fc: 0.974 / Cor.coef. Fo:Fc free: 0.966 / SU B: 2.396 / SU ML: 0.043 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / ESU R: 0.061 / ESU R Free: 0.062 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: (1) HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. (2) THE ASSIGNMENT OF NA ION WAS BASED ON COORDINATION, GEOMETRY, AND THE ABSENCE OF AN ANOMALOUS DIFFERENCE PEAK. (3) THERE ARE ...詳細: (1) HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. (2) THE ASSIGNMENT OF NA ION WAS BASED ON COORDINATION, GEOMETRY, AND THE ABSENCE OF AN ANOMALOUS DIFFERENCE PEAK. (3) THERE ARE DIFFERENCE DENSITY PEAKS ALONG THE CRYSTALLOGRAPHIC 2-FOLD THAT WERE LEFT UNMODELED. (4) TLS GROUP PARTITIONING WAS AIDED BY TLSMD.
Rfactor
反射数
%反射
Selection details
Rfree
0.175
1332
5.1 %
RANDOM
Rwork
0.153
-
-
-
all
0.154
-
-
-
obs
0.15407
26310
93.03 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 15.075 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.81 Å2
0 Å2
-0.93 Å2
2-
-
1.03 Å2
0 Å2
3-
-
-
-0.91 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.5→44.42 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1053
0
40
109
1202
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.016
0.022
1216
X-RAY DIFFRACTION
r_bond_other_d
0.002
0.02
1124
X-RAY DIFFRACTION
r_angle_refined_deg
1.648
1.984
1653
X-RAY DIFFRACTION
r_angle_other_deg
0.829
3
2623
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.154
5
158
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.576
23.962
53
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.099
15
227
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
11.71
15
6
X-RAY DIFFRACTION
r_chiral_restr
0.098
0.2
182
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.02
1342
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
263
X-RAY DIFFRACTION
r_nbd_refined
0.212
0.2
207
X-RAY DIFFRACTION
r_nbd_other
0.184
0.2
1071
X-RAY DIFFRACTION
r_nbtor_refined
0.185
0.2
591
X-RAY DIFFRACTION
r_nbtor_other
0.084
0.2
708
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.143
0.2
80
X-RAY DIFFRACTION
r_metal_ion_refined
0.011
0.2
2
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.333
0.2
10
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.162
0.2
56
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.1
0.2
10
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
0.105
0.2
2
X-RAY DIFFRACTION
r_mcbond_it
1.608
3
715
X-RAY DIFFRACTION
r_mcbond_other
0.488
3
296
X-RAY DIFFRACTION
r_mcangle_it
2.775
5
1168
X-RAY DIFFRACTION
r_scbond_it
4.936
8
510
X-RAY DIFFRACTION
r_scangle_it
7.609
11
475
LS精密化 シェル
解像度: 1.5→1.539 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.375
61
-
Rwork
0.261
1236
-
obs
-
1297
63.15 %
精密化 TLS
手法: refined / Refine-ID: X-RAY DIFFRACTION
ID
L11 (°2)
L12 (°2)
L13 (°2)
L22 (°2)
L23 (°2)
L33 (°2)
S11 (Å °)
S12 (Å °)
S13 (Å °)
S21 (Å °)
S22 (Å °)
S23 (Å °)
S31 (Å °)
S32 (Å °)
S33 (Å °)
T11 (Å2)
T12 (Å2)
T13 (Å2)
T22 (Å2)
T23 (Å2)
T33 (Å2)
Origin x (Å)
Origin y (Å)
Origin z (Å)
1
3.6813
-0.5782
1.2879
2.4591
-0.3377
3.5422
0.1059
-0.2571
-0.1452
0.0092
0.0151
0.2647
0.1727
-0.2989
-0.121
0.0612
-0.0185
-0.0053
0.031
0.0159
0.0847
2.478
31.701
10.696
2
9.7573
-7.0947
0.6422
10.376
-0.6559
2.8558
0.1661
0.5073
-0.3442
-0.5108
-0.0636
0.1848
0.3931
-0.0174
-0.1025
0.0782
0.0051
-0.0149
0.0919
-0.0372
0.0421
12.112
31.678
-1.68
3
2.6254
0.2282
0.3381
1.081
0.0837
2.4316
0.0369
-0.1211
0.0119
0.0751
0.0377
-0.0205
0.0296
0.2446
-0.0746
0.0431
0.0169
0.0094
0.08
-0.0154
0.0291
18.875
37.575
10.539
4
2.7386
-3.6874
-3.0917
8.7482
11.8285
20.8118
0.0702
-0.0559
0.1873
-0.276
0.0791
-0.0312
-0.6152
0.4024
-0.1493
0.1117
-0.0584
0.0336
0.0633
-0.0097
-0.0081
18.093
43.563
30.945
精密化 TLSグループ
Refine-ID: X-RAY DIFFRACTION / Selection: ALL / Auth asym-ID: A / Label asym-ID: A