解像度: 1.6→1.686 Å / 冗長度: 7 % / Rmerge(I) obs: 0.87 / Mean I/σ(I) obs: 2.4 / Num. unique all: 3603 / Rsym value: 0.87 / % possible all: 80.49
-
解析
ソフトウェア
名称
バージョン
分類
REFMAC
5.2.0005
精密化
Blu-Ice
データ収集
SCALEPACK
データスケーリング
SOLVE
位相決定
精密化
構造決定の手法: 単波長異常分散 / 解像度: 1.6→45.64 Å / Cor.coef. Fo:Fc: 0.967 / Cor.coef. Fo:Fc free: 0.948 / SU B: 4.105 / SU ML: 0.071 / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 0.099 / ESU R Free: 0.101 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: Atoms with little to no electron density are represented in this PDB file as having zero occupancy, and the atomic displacement parameters for these atoms have been set to zero. These atoms ...詳細: Atoms with little to no electron density are represented in this PDB file as having zero occupancy, and the atomic displacement parameters for these atoms have been set to zero. These atoms have been included in this file with geometry corresponding to that which would be obtained in refinement, however they were not included in the calculations for the residuals. Residues ASP A 50 and ILE A 190 exist in generously allowed and disallowed sectors of the Ramachandran plot and exhibit outstanding omit map electron density. ILE A 142 is on the edge of the additionally allowed and generously allowed sector of the plot as calculated with PROCHECK and MOLEMAN2.
Rfactor
反射数
%反射
Selection details
Rfree
0.21068
1420
4.7 %
RANDOM
Rwork
0.16976
-
-
-
all
0.17171
28550
-
-
obs
0.17171
28550
91.22 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 26.651 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.85 Å2
0 Å2
0 Å2
2-
-
-0.96 Å2
0 Å2
3-
-
-
0.11 Å2
Refine analyze
Free
Obs
Luzzati coordinate error
0.32 Å
0.29 Å
Luzzati d res low
-
1.6 Å
Luzzati sigma a
0.17 Å
0.2 Å
精密化ステップ
サイクル: LAST / 解像度: 1.6→45.64 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1989
0
50
181
2220
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.009
0.022
2173
X-RAY DIFFRACTION
r_angle_refined_deg
1.305
2.011
2931
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.189
5
250
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
31.409
25.368
95
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.294
15
397
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
19.213
15
6
X-RAY DIFFRACTION
r_chiral_restr
0.085
0.2
339
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
1555
X-RAY DIFFRACTION
r_nbd_refined
0.201
0.2
1074
X-RAY DIFFRACTION
r_nbtor_refined
0.31
0.2
1481
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.114
0.2
169
X-RAY DIFFRACTION
r_metal_ion_refined
0.033
0.2
3
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.204
0.2
60
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.102
0.2
17
X-RAY DIFFRACTION
r_mcbond_it
1.734
2
1317
X-RAY DIFFRACTION
r_mcangle_it
2.29
3
2098
X-RAY DIFFRACTION
r_scbond_it
3.712
4
957
X-RAY DIFFRACTION
r_scangle_it
5.173
6
833
LS精密化 シェル
解像度: 1.6→1.686 Å / Total num. of bins used: 10
Rfactor
反射数
%反射
Rfree
0.299
192
-
Rwork
0.234
3603
-
obs
-
-
80.49 %
精密化 TLS
手法: refined / Origin x: 19.919 Å / Origin y: 30.759 Å / Origin z: 29.698 Å