ソフトウェア 名称 バージョン 分類 NB EPMR2.5 位相決定 Show PDB_EXTRACT1.6 データ抽出 Show DENZOデータ削減 Show SCALEPACKデータスケーリング Show REFMACrefmac_5.2.0005 24/04/2001精密化 Show
精密化 構造決定の手法 : 分子置換開始モデル : pdb entry 1ISC解像度 : 2.33→20 Å / Cor.coef. Fo :Fc : 0.958 / Cor.coef. Fo :Fc free : 0.948 / WRfactor Rfree : 0.202 / WRfactor Rwork : 0.171 / TLS residual ADP flag : LIKELY RESIDUAL / Isotropic thermal model : isotropic / 交差検証法 : THROUGHOUT / σ(F) : 0 / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.2017 1493 5.081 % random Rwork 0.1707 - - - obs - 29383 98.963 % -
溶媒の処理 溶媒モデル : BABINET MODEL PLUS MASK原子変位パラメータ Biso mean : 28.207 Å2 Baniso -1 Baniso -2 Baniso -3 1- 1.332 Å2 0.666 Å2 0 Å2 2- - 1.332 Å2 0 Å2 3- - - -1.997 Å2
精密化ステップ サイクル : LAST / 解像度 : 2.33→20 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 3133 0 3 256 3392
拘束条件 大きな表を表示 (5 x 27) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.01 0.021 3260 X-RAY DIFFRACTION r_bond_other_d0.001 0.02 2732 X-RAY DIFFRACTION r_angle_refined_deg1.087 1.899 4447 X-RAY DIFFRACTION r_angle_other_deg0.707 3 6391 X-RAY DIFFRACTION r_dihedral_angle_1_deg5.484 5 392 X-RAY DIFFRACTION r_dihedral_angle_2_deg33.826 25.412 170 X-RAY DIFFRACTION r_dihedral_angle_3_deg12.662 15 495 X-RAY DIFFRACTION r_dihedral_angle_4_deg6.173 15 4 X-RAY DIFFRACTION r_chiral_restr0.068 0.2 465 X-RAY DIFFRACTION r_gen_planes_refined0.004 0.02 3696 X-RAY DIFFRACTION r_gen_planes_other0 0.02 668 X-RAY DIFFRACTION r_nbd_refined0.208 0.3 757 X-RAY DIFFRACTION r_nbd_other0.18 0.3 2668 X-RAY DIFFRACTION r_nbtor_refined0.19 0.5 1610 X-RAY DIFFRACTION r_nbtor_other0.089 0.5 1572 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.188 0.5 346 X-RAY DIFFRACTION r_symmetry_vdw_refined0.17 0.3 13 X-RAY DIFFRACTION r_symmetry_vdw_other0.223 0.3 23 X-RAY DIFFRACTION r_symmetry_hbond_refined0.308 0.5 14 X-RAY DIFFRACTION r_mcbond_it0.896 2 2527 X-RAY DIFFRACTION r_mcbond_other0.167 2 807 X-RAY DIFFRACTION r_mcangle_it1.175 3 3134 X-RAY DIFFRACTION r_mcangle_other0.513 3 2734 X-RAY DIFFRACTION r_scbond_it1.888 4 1601 X-RAY DIFFRACTION r_scbond_other0.57 4 2680 X-RAY DIFFRACTION r_scangle_it2.641 6 1313 X-RAY DIFFRACTION r_scangle_other1.091 6 3657
LS精密化 シェル Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (7 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Num. reflection all % reflection obs (%)2.33-2.391 0.332 107 0.224 1737 2110 87.393 2.391-2.456 0.288 91 0.211 1937 2064 98.256 2.456-2.526 0.25 107 0.208 1917 2026 99.901 2.526-2.602 0.263 103 0.188 1844 1949 99.897 2.602-2.686 0.224 111 0.187 1802 1913 100 2.686-2.778 0.197 107 0.174 1748 1855 100 2.778-2.881 0.174 83 0.166 1687 1770 100 2.881-2.996 0.172 94 0.163 1652 1746 100 2.996-3.126 0.199 95 0.168 1552 1647 100 3.126-3.275 0.207 80 0.174 1523 1603 100 3.275-3.447 0.206 54 0.169 1463 1517 100 3.447-3.649 0.216 85 0.181 1378 1464 99.932 3.649-3.892 0.216 70 0.16 1303 1374 99.927 3.892-4.19 0.203 69 0.142 1213 1282 100 4.19-4.57 0.13 51 0.139 1154 1205 100 4.57-5.077 0.203 40 0.144 1048 1088 100 5.077-5.8 0.173 44 0.184 954 998 100 5.8-6.959 0.212 50 0.189 813 863 100 6.959-9.295 0.139 34 0.159 678 712 100 9.295-20 0.147 18 0.201 487 505 100
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 2) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 1.172 -0.063 0.262 0.619 -0.3141 2.0785 -0.0366 -0.0468 0.1608 0.0235 -0.0086 0.0157 -0.1094 0.0184 0.0453 0.0016 0.022 -0.0003 0.0132 -0.0133 -0.0023 30.27 30.581 122.267 2 1.5276 -0.5094 -0.0564 0.9766 0.2435 4.0993 0.0795 0.1412 0.1845 0.01 -0.0379 -0.1936 -0.0909 0.2673 -0.0416 0.0353 0.0432 0.008 0.0043 0.0161 -0.0213 28.505 29.524 136.478
精密化 TLSグループ Refine-ID : X-RAY DIFFRACTION / Selection : ALL / Auth seq-ID : 1 - 197 / Label seq-ID : 9 - 205
ID Refine TLS-ID Auth asym-ID Label asym-ID 1 1 AA2 2 BB