ソフトウェア | 名称 | 分類 |
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AMoRE | 位相決定 | X-PLOR | 精密化 | IPMOSFLM | データ削減 |
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精密化 | 構造決定の手法: 分子置換 開始モデル: BDL001 解像度: 2.05→8 Å / σ(F): 4 / | Rfactor | 反射数 | %反射 |
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Rwork | 0.168 | - | - |
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obs | 0.168 | 2379 | 79.5 % |
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Refine Biso | クラス | Refine-ID | 詳細 | Treatment |
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ALL ATOMSX-RAY DIFFRACTION | TRisotropicALL WATERSX-RAY DIFFRACTION | TRisotropic | | | | | |
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精密化ステップ | サイクル: LAST / 解像度: 2.05→8 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 0 | 366 | 2 | 86 | 454 |
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拘束条件 | Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | x_bond_d0.015 | X-RAY DIFFRACTION | x_bond_d_na | X-RAY DIFFRACTION | x_bond_d_prot | X-RAY DIFFRACTION | x_angle_d | X-RAY DIFFRACTION | x_angle_d_na | X-RAY DIFFRACTION | x_angle_d_prot | X-RAY DIFFRACTION | x_angle_deg3.21 | X-RAY DIFFRACTION | x_angle_deg_na | X-RAY DIFFRACTION | x_angle_deg_prot | X-RAY DIFFRACTION | x_dihedral_angle_d25.5 | X-RAY DIFFRACTION | x_dihedral_angle_d_na | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | X-RAY DIFFRACTION | x_improper_angle_d0.88 | X-RAY DIFFRACTION | x_improper_angle_d_na | X-RAY DIFFRACTION | x_improper_angle_d_prot | X-RAY DIFFRACTION | x_mcbond_it | X-RAY DIFFRACTION | x_mcangle_it | X-RAY DIFFRACTION | x_scbond_it | X-RAY DIFFRACTION | x_scangle_it | | | | | | | | | | | | | | | | | | | |
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ソフトウェア | *PLUS 名称: X-PLOR / 分類: refinement |
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精密化 | *PLUS 最高解像度: 2.05 Å / 最低解像度: 8 Å / σ(F): 4 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS Biso mean: 18.4 Å2 |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | x_dihedral_angle_d | X-RAY DIFFRACTION | x_dihedral_angle_deg25.5 | X-RAY DIFFRACTION | x_improper_angle_d | X-RAY DIFFRACTION | x_improper_angle_deg0.883 | | | | |
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