ソフトウェア | 名称 | バージョン | 分類 |
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REFMAC | 5.1.24精密化 | HKL-2000 | | データ削減 | CCP4 | (SCALA)データスケーリング | SHARP | | 位相決定 | | |
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精密化 | 構造決定の手法: 多波長異常分散 / 解像度: 3.5→10 Å / Cor.coef. Fo:Fc: 0.912 / Cor.coef. Fo:Fc free: 0.907 / SU B: 38.389 / SU ML: 0.579 / 交差検証法: THROUGHOUT / ESU R Free: 0.627 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: Ramachandran plot: Favored (%) = 79.2; Allowed (%) = 20.0; Generously allowed (%) = 0.8 and Disallowed (%) = 0.0.
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.3091 | 1428 | 5 % | RANDOM |
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Rwork | 0.28988 | - | - | - |
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obs | 0.29086 | 27199 | 97.1 % | - |
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all | - | 27199 | - | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK |
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原子変位パラメータ | Biso mean: 124.432 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 4.83 Å2 | 2.41 Å2 | 0 Å2 |
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2- | - | 4.83 Å2 | 0 Å2 |
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3- | - | - | -7.24 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 3.5→10 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 8652 | 0 | 0 | 0 | 8652 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.012 | 0.022 | 8811 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg1.545 | 1.974 | 12054 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg2.948 | 5 | 1212 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_3_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_4_deg | | | X-RAY DIFFRACTION | r_chiral_restr0.12 | 0.2 | 1536 | X-RAY DIFFRACTION | r_gen_planes_refined0.007 | 0.02 | 6402 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined0.261 | 0.3 | 5355 | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_refined | | | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.228 | 0.5 | 605 | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.177 | 0.3 | 4 | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined | | | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_mcbond_it1.036 | 2 | 6003 | X-RAY DIFFRACTION | r_mcbond_other | | | X-RAY DIFFRACTION | r_mcangle_it1.865 | 3 | 9537 | X-RAY DIFFRACTION | r_scbond_it0.759 | 2 | 2808 | X-RAY DIFFRACTION | r_scangle_it1.231 | 3 | 2517 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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Refine LS restraints NCS | Ens-ID: 1 / Refine-ID: X-RAY DIFFRACTION Dom-ID | Auth asym-ID | 数 | タイプ | Rms dev position (Å) | Weight position |
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1 | A1540 | tight positional0.17 | 0.2 | 2 | B1540 | tight positional0.16 | 0.2 | 3 | C1540 | tight positional0.15 | 0.2 | 1 | A1214 | medium positional0.27 | 2 | 2 | B1214 | medium positional0.27 | 2 | 3 | C1214 | medium positional0.26 | 2 | 1 | A1540 | tight thermal16.52 | 3 | 2 | B1540 | tight thermal9.84 | 3 | 3 | C1540 | tight thermal8.21 | 3 | 1 | A1214 | medium thermal16.88 | 10 | 2 | B1214 | medium thermal10.12 | 10 | 3 | C1214 | medium thermal8.43 | 10 | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 3.5→3.58 Å / Total num. of bins used: 20 / | Rfactor | 反射数 |
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Rfree | 0.409 | 89 |
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Rwork | 0.37 | 1739 |
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ソフトウェア | *PLUS バージョン: 5.1.24 / 分類: refinement |
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精密化 | *PLUS % reflection Rfree: 5 % |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ |
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X-RAY DIFFRACTION | p_chiral_restrX-RAY DIFFRACTION | p_mcbond_itX-RAY DIFFRACTION | p_scbond_itX-RAY DIFFRACTION | p_mcangle_itX-RAY DIFFRACTION | p_scangle_it | | | | |
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LS精密化 シェル | *PLUS Rfactor Rfree: 0.409 / Rfactor Rwork: 0.37 |
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