| ソフトウェア | | 名称 | バージョン | 分類 |
|---|
| REFMAC | 5 | 精密化 | | DENZO | | データ削減 | | SCALEPACK | | データスケーリング | | SOLVE | | 位相決定 |
|
|---|
| 精密化 | 構造決定の手法: 単波長異常分散 / 解像度: 1.894→12 Å / Cor.coef. Fo:Fc: 0.95 / Cor.coef. Fo:Fc free: 0.937 / SU B: 3.105 / SU ML: 0.091 / TLS residual ADP flag: LIKELY RESIDUAL / Isotropic thermal model: Isotropic / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 0.151 / ESU R Free: 0.138 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD
| Rfactor | 反射数 | %反射 | Selection details |
|---|
| Rfree | 0.23423 | 712 | 5 % | RANDOM |
|---|
| Rwork | 0.20524 | - | - | - |
|---|
| all | 0.21522 | - | - | - |
|---|
| obs | 0.20658 | 13420 | 100 % | - |
|---|
|
|---|
| 溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK |
|---|
| 原子変位パラメータ | Biso mean: 22.066 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
|---|
| 1- | -0.17 Å2 | 0 Å2 | 0 Å2 |
|---|
| 2- | - | -0.17 Å2 | 0 Å2 |
|---|
| 3- | - | - | 0.35 Å2 |
|---|
|
|---|
| Refine analyze | | Free | Obs |
|---|
| Luzzati coordinate error | 0.133 Å | 0.146 Å |
|---|
|
|---|
| 精密化ステップ | サイクル: LAST / 解像度: 1.894→12 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
|---|
| 原子数 | 1151 | 0 | 0 | 50 | 1201 |
|---|
|
|---|
| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
|---|
| X-RAY DIFFRACTION | r_bond_refined_d| 0.013 | 0.021 | 1166 | | X-RAY DIFFRACTION | r_angle_refined_deg| 1.524 | 1.987 | 1558 | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg| 3.598 | 3 | 140 | | X-RAY DIFFRACTION | r_dihedral_angle_2_deg| 15.534 | 15 | 247 | | X-RAY DIFFRACTION | r_chiral_restr| 0.106 | 0.2 | 172 | | X-RAY DIFFRACTION | r_gen_planes_refined| 0.005 | 0.02 | 844 | | X-RAY DIFFRACTION | r_nbd_refined| 0.213 | 0.3 | 479 | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined| 0.221 | 0.5 | 83 | | X-RAY DIFFRACTION | r_symmetry_vdw_refined| 0.305 | 0.3 | 29 | | X-RAY DIFFRACTION | r_symmetry_hbond_refined| 0.532 | 0.5 | 20 | | X-RAY DIFFRACTION | r_mcbond_it| 0.781 | 1.5 | 696 | | X-RAY DIFFRACTION | r_mcangle_it| 1.504 | 2 | 1119 | | X-RAY DIFFRACTION | r_scbond_it| 2.655 | 3 | 470 | | X-RAY DIFFRACTION | r_scangle_it| 4.527 | 4.5 | 439 | | | | | | | | | | | | | | |
|
|---|
| LS精密化 シェル | 解像度: 1.894→1.943 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
|---|
| Rfree | 0.246 | 48 | - |
|---|
| Rwork | 0.22 | 939 | - |
|---|
| obs | - | 982 | 82 % |
|---|
|
|---|
| 精密化 TLS | 手法: refined / Origin x: 47.99 Å / Origin y: 18.021 Å / Origin z: 43.601 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
|---|
| T | 0.1014 Å2 | -0.0123 Å2 | -0.0396 Å2 | - | 0.0064 Å2 | -0.0086 Å2 | - | - | 0.0522 Å2 |
|---|
| L | 2.8889 °2 | -0.7968 °2 | 1.4808 °2 | - | 3.9555 °2 | -0.2594 °2 | - | - | 3.0802 °2 |
|---|
| S | 0.0887 Å ° | -0.0857 Å ° | 0.0419 Å ° | 0.1687 Å ° | -0.0634 Å ° | -0.2591 Å ° | 0.0133 Å ° | 0.1127 Å ° | -0.0253 Å ° |
|---|
|
|---|
| ソフトウェア | *PLUS バージョン: 5 / 分類: refinement |
|---|
| 精密化 | *PLUS 最高解像度: 1.89 Å / Num. reflection obs: 15227 / % reflection Rfree: 5 % / Rfactor Rfree: 0.234 / Rfactor Rwork: 0.201 |
|---|
| 溶媒の処理 | *PLUS |
|---|
| 原子変位パラメータ | *PLUS |
|---|
| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
|---|
| X-RAY DIFFRACTION | r_bond_d| 0.013 | | X-RAY DIFFRACTION | r_angle_d | | X-RAY DIFFRACTION | r_angle_deg| 1.524 | | | |
|
|---|