| ソフトウェア | | 名称 | バージョン | 分類 |
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| XDS | | データスケーリング | | XDS | | データ削減 | X-PLOR | | モデル構築 | X-PLOR | 3.851 | 精密化 | X-PLOR | | 位相決定 |
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| 精密化 | 解像度: 2.1→10 Å / Rfactor Rfree error: 0.012 / Data cutoff high absF: 10000000 / Data cutoff low absF: 0 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 1
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.282 | 564 | 10.8 % | RANDOM |
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| Rwork | 0.218 | - | - | - |
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| obs | 0.218 | 5300 | 75.5 % | - |
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| all | - | 5378 | - | - |
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| 原子変位パラメータ | Biso mean: 20.6 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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| 1- | 0 Å2 | 0 Å2 | 0 Å2 |
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| 2- | - | 0 Å2 | 0 Å2 |
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| 3- | - | - | 0 Å2 |
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| Refine analyze | | Free | Obs |
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| Luzzati coordinate error | 0.35 Å | 0.26 Å |
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| Luzzati d res low | - | 3.8 Å |
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| Luzzati sigma a | 0.3 Å | 0.25 Å |
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| 精密化ステップ | サイクル: LAST / 解像度: 2.1→10 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 1140 | 0 | 5 | 123 | 1268 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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| X-RAY DIFFRACTION | x_bond_d| 0.007 | | | X-RAY DIFFRACTION | x_angle_deg| 1.1 | | | X-RAY DIFFRACTION | x_dihedral_angle_d| 28.3 | | | X-RAY DIFFRACTION | x_improper_angle_d| 0.55 | | | X-RAY DIFFRACTION | x_mcbond_it| 2.47 | 1.5 | | X-RAY DIFFRACTION | x_mcangle_it| 3.8 | 2 | | X-RAY DIFFRACTION | x_scbond_it| 6.09 | 2 | | X-RAY DIFFRACTION | x_scangle_it| 10.35 | 2.5 | | | | | | | | |
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| LS精密化 シェル | 解像度: 2.1→2.21 Å / Rfactor Rfree error: 0.037 / Total num. of bins used: 7
| Rfactor | 反射数 | %反射 |
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| Rfree | 0.301 | 66 | 12.1 % |
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| Rwork | 0.27 | 480 | - |
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| obs | - | - | 56.9 % |
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| ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.851 / 分類: refinement |
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| 精密化 | *PLUS σ(F): 1 / % reflection Rfree: 10.8 % / Rfactor obs: 0.204 / Rfactor Rfree: 0.27 |
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| 溶媒の処理 | *PLUS |
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| 原子変位パラメータ | *PLUS Biso mean: 20.6 Å2 |
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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| X-RAY DIFFRACTION | x_bond_d| 0.007 | | | X-RAY DIFFRACTION | x_angle_deg| 1.1 | | | X-RAY DIFFRACTION | x_dihedral_angle_d | | | X-RAY DIFFRACTION | x_dihedral_angle_deg| 28.3 | | | X-RAY DIFFRACTION | x_improper_angle_d | | | X-RAY DIFFRACTION | x_improper_angle_deg| 0.55 | | | X-RAY DIFFRACTION | x_mcbond_it | 1.5 | | X-RAY DIFFRACTION | x_scbond_it | 2 | | X-RAY DIFFRACTION | x_mcangle_it | 2 | | X-RAY DIFFRACTION | x_scangle_it | 2.5 | | | | | | | | | | |
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| LS精密化 シェル | *PLUS Rfactor Rfree: 0.301 / % reflection Rfree: 12.1 % / Rfactor Rwork: 0.27 |
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