ソフトウェア | 名称 | 分類 |
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DENZO | データ削減 | SCALEPACK | データスケーリング | CNS | 精密化 | CNS | 位相決定 |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 1.85→19.98 Å / Rfactor Rfree error: 0.003 / Data cutoff high absF: 886732.24 / Data cutoff low absF: 0 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0 / 立体化学のターゲット値: Engh & Huber
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.214 | 5712 | 9.6 % | RANDOM |
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Rwork | 0.185 | - | - | - |
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obs | 0.188 | 52222 | 90.7 % | - |
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all | - | 65289 | - | - |
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溶媒の処理 | 溶媒モデル: FLAT MODEL / Bsol: 59.3173 Å2 / ksol: 0.426506 e/Å3 |
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原子変位パラメータ | Biso mean: 19.6 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 3.71 Å2 | 0 Å2 | 0 Å2 |
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2- | - | -3.51 Å2 | 0 Å2 |
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3- | - | - | -0.2 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.22 Å | 0.19 Å |
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Luzzati d res low | - | 5 Å |
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Luzzati sigma a | 0.08 Å | 0.08 Å |
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精密化ステップ | サイクル: LAST / 解像度: 1.85→19.98 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2720 | 0 | 82 | 304 | 3106 |
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拘束条件 | Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | c_bond_d0.005 | X-RAY DIFFRACTION | c_bond_d_na | X-RAY DIFFRACTION | c_bond_d_prot | X-RAY DIFFRACTION | c_angle_d | X-RAY DIFFRACTION | c_angle_d_na | X-RAY DIFFRACTION | c_angle_d_prot | X-RAY DIFFRACTION | c_angle_deg1.4 | X-RAY DIFFRACTION | c_angle_deg_na | X-RAY DIFFRACTION | c_angle_deg_prot | X-RAY DIFFRACTION | c_dihedral_angle_d22.7 | X-RAY DIFFRACTION | c_dihedral_angle_d_na | X-RAY DIFFRACTION | c_dihedral_angle_d_prot | X-RAY DIFFRACTION | c_improper_angle_d1.22 | X-RAY DIFFRACTION | c_improper_angle_d_na | X-RAY DIFFRACTION | c_improper_angle_d_prot | X-RAY DIFFRACTION | c_mcbond_it | X-RAY DIFFRACTION | c_mcangle_it | X-RAY DIFFRACTION | c_scbond_it | X-RAY DIFFRACTION | c_scangle_it | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.85→1.97 Å / Rfactor Rfree error: 0.008 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
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Rfree | 0.219 | 811 | 8.9 % |
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Rwork | 0.19 | 8283 | - |
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obs | - | - | 83.6 % |
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Xplor file | Refine-ID | Serial no | Param file | Topol file |
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X-RAY DIFFRACTION | 1 | PROTEIN_REP.PARAMBB2.TOPX-RAY DIFFRACTION | 2 | WATER_REP.PARAMMHA.TOPX-RAY DIFFRACTION | 3 | ION.PARAM | X-RAY DIFFRACTION | 4 | BB2.PARAM | X-RAY DIFFRACTION | 5 | MHA.PARAM | | | | | | | |
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精密化 | *PLUS 最低解像度: 20 Å / Num. reflection obs: 59330 / % reflection Rfree: 10 % |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | c_dihedral_angle_d | X-RAY DIFFRACTION | c_dihedral_angle_deg22.7 | X-RAY DIFFRACTION | c_improper_angle_d | X-RAY DIFFRACTION | c_improper_angle_deg1.22 | | | | |
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LS精密化 シェル | *PLUS Rfactor Rwork: 0.19 / Num. reflection Rwork: 8287 / Rfactor obs: 0.19 |
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