SHEET DETERMINATION METHOD: DSSP THE SHEETS PRESENTED AS "AE" IN EACH CHAIN ON SHEET RECORDS BELOW ... SHEET DETERMINATION METHOD: DSSP THE SHEETS PRESENTED AS "AE" IN EACH CHAIN ON SHEET RECORDS BELOW IS ACTUALLY AN 7-STRANDED BARREL THIS IS REPRESENTED BY A 8-STRANDED SHEET IN WHICH THE FIRST AND LAST STRANDS ARE IDENTICAL.
解像度: 2.9→12 Å / Rfactor Rfree error: 0.008 / Data cutoff high absF: 1013268.36 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0 立体化学のターゲット値: MAXIMUM LIKELIHOOD USING AMPLITUDES
Rfactor
反射数
%反射
Selection details
Rfree
0.29
1311
4.8 %
RANDOM
Rwork
0.242
-
-
-
obs
0.242
27235
98.3 %
-
原子変位パラメータ
Biso mean: 59.4 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.43 Å2
0 Å2
0 Å2
2-
-
4.81 Å2
0 Å2
3-
-
-
-6.25 Å2
Refine analyze
Free
Obs
Luzzati coordinate error
0.51 Å
0.38 Å
Luzzati d res low
-
5 Å
Luzzati sigma a
0.52 Å
0.43 Å
精密化ステップ
サイクル: LAST / 解像度: 2.9→12 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
5855
0
101
14
5970
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
X-RAY DIFFRACTION
c_bond_d
0.015
X-RAY DIFFRACTION
c_bond_d_na
X-RAY DIFFRACTION
c_bond_d_prot
X-RAY DIFFRACTION
c_angle_d
X-RAY DIFFRACTION
c_angle_d_na
X-RAY DIFFRACTION
c_angle_d_prot
X-RAY DIFFRACTION
c_angle_deg
1.9
X-RAY DIFFRACTION
c_angle_deg_na
X-RAY DIFFRACTION
c_angle_deg_prot
X-RAY DIFFRACTION
c_dihedral_angle_d
26.2
X-RAY DIFFRACTION
c_dihedral_angle_d_na
X-RAY DIFFRACTION
c_dihedral_angle_d_prot
X-RAY DIFFRACTION
c_improper_angle_d
1.26
X-RAY DIFFRACTION
c_improper_angle_d_na
X-RAY DIFFRACTION
c_improper_angle_d_prot
X-RAY DIFFRACTION
c_mcbond_it
3.46
1.5
X-RAY DIFFRACTION
c_mcangle_it
5.43
2
X-RAY DIFFRACTION
c_scbond_it
4.98
2
X-RAY DIFFRACTION
c_scangle_it
6.94
2.5
LS精密化 シェル
解像度: 2.9→3.08 Å / Rfactor Rfree error: 0.031 / Total num. of bins used: 6