ソフトウェア | 名称 | バージョン | 分類 |
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X-PLOR | | モデル構築 | CNS | 1 | 精密化 | X-PLOR | | 位相決定 |
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精密化 | 解像度: 2.3→6 Å / Rfactor Rfree error: 0.006 / Data cutoff high absF: 2474507.12 / Data cutoff low absF: 0 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 2 / 立体化学のターゲット値: Engh & Huber
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.221 | 1600 | 9.9 % | RANDOM |
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Rwork | 0.173 | - | - | - |
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obs | 0.173 | 16105 | 88.5 % | - |
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原子変位パラメータ | Biso mean: 28.9 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0 Å2 | 0 Å2 | 0 Å2 |
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2- | - | 0 Å2 | 0 Å2 |
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3- | - | - | 0 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.3 Å | 0.24 Å |
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Luzzati d res low | - | 6 Å |
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Luzzati sigma a | 0.38 Å | 0.34 Å |
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精密化ステップ | サイクル: LAST / 解像度: 2.3→6 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2594 | 0 | 0 | 55 | 2649 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | c_bond_d0.007 | | X-RAY DIFFRACTION | c_angle_deg1.3 | | X-RAY DIFFRACTION | c_dihedral_angle_d23.4 | | X-RAY DIFFRACTION | c_improper_angle_d1.34 | | X-RAY DIFFRACTION | c_mcbond_it2.54 | 1.5 | X-RAY DIFFRACTION | c_mcangle_it3.76 | 2 | X-RAY DIFFRACTION | c_scbond_it22.27 | 2 | X-RAY DIFFRACTION | c_scangle_it19.21 | 2.5 | | | | | | | | |
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LS精密化 シェル | 解像度: 2.3→2.44 Å / Rfactor Rfree error: 0.023 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
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Rfree | 0.297 | 174 | 10.6 % |
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Rwork | 0.253 | 1474 | - |
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obs | - | - | 41.4 % |
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Xplor file | Refine-ID | Serial no | Param file | Topol file |
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X-RAY DIFFRACTION | 1 | PROTEIN_REP.PARAMPROTEIN.TOPX-RAY DIFFRACTION | 2 | WATER_REP.PARAMWATER.PARAMX-RAY DIFFRACTION | 4 | | PROTEIN.LINKX-RAY DIFFRACTION | 5 | | WATER_REP.PARAM | | | | | |
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ソフトウェア | *PLUS 名称: CNS / バージョン: 1 / 分類: refinement |
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精密化 | *PLUS σ(F): 2 / % reflection Rfree: 9.9 % / 最高解像度: 2.3 Å / 最低解像度: 6 Å / Rfactor obs: 0.173 / Rfactor Rfree: 0.221 / Rfactor Rwork: 0.179 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS Biso mean: 28.9 Å2 |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | c_angle_deg1.387 | | X-RAY DIFFRACTION | c_dihedral_angle_d | | X-RAY DIFFRACTION | c_dihedral_angle_deg23.4 | | X-RAY DIFFRACTION | c_improper_angle_d | | X-RAY DIFFRACTION | c_improper_angle_deg1.34 | | X-RAY DIFFRACTION | c_mcbond_it2.54 | 1.5 | X-RAY DIFFRACTION | c_scbond_it22.27 | 2 | X-RAY DIFFRACTION | c_mcangle_it3.76 | 2 | X-RAY DIFFRACTION | c_scangle_it19.21 | 2.5 | | | | | | | | | |
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LS精密化 シェル | *PLUS Rfactor Rfree: 0.297 / % reflection Rfree: 10.6 % / Rfactor Rwork: 0.253 |
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