| ソフトウェア | | 名称 | バージョン | 分類 | 
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 |  CCP4 |  | モデル構築 |  | CNS | 1 | 精密化 |  | MOSFLM |  | データ削減 |  |  CCP4 | (SCALA) | データスケーリング | |  CCP4 |  | 位相決定 |  | 
 | 
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| 精密化 | 構造決定の手法:  多重同系置換 / 解像度: 1.95→19.68 Å / Rfactor Rfree error: 0.004  / Data cutoff high absF: 3832033.19  / Data cutoff high rms absF: 3832033.19  / Data cutoff low absF: 0  / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0  / σ(I): 0  / 立体化学のターゲット値: Engh & Huber 
 |  | Rfactor | 反射数 | %反射 | Selection details | 
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 | Rfree | 0.231 | 2835 | 5.1 % | RANDOM | 
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 | Rwork | 0.196 | - | - | - | 
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 | all | 0.196 | 55315 | - | - | 
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 | obs | 0.196 | 55315 | 98.1 % | - | 
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 | 
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| 溶媒の処理 | 溶媒モデル: FLAT MODEL / Bsol: 67.13 Å2 / ksol: 0.38 e/Å3 | 
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| 原子変位パラメータ | Biso  mean: 35.4 Å2 
 |  | Baniso -1 | Baniso -2 | Baniso -3 | 
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 | 1- | -2.39 Å2 | -0.09 Å2 | 0 Å2 | 
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 | 2- | - | -2.39 Å2 | 0 Å2 | 
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 | 3- | - | - | 4.78 Å2 | 
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 | 
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| Refine analyze | |  | Free | Obs | 
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 | Luzzati coordinate error | 0.26 Å | 0.22 Å | 
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 | Luzzati d res low | - | 5 Å | 
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 | Luzzati sigma a | 0.2 Å | 0.18 Å | 
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 | 
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| 精密化ステップ | サイクル: LAST / 解像度: 1.95→19.68 Å 
 |  | タンパク質 | 核酸 | リガンド | 溶媒 | 全体 | 
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 | 原子数 | 4077 | 0 | 73 | 566 | 4716 | 
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 | 
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target | 
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 | X-RAY DIFFRACTION | c_bond_d | 0.01 |  | | X-RAY DIFFRACTION | c_angle_deg | 1.5 |  | | X-RAY DIFFRACTION | c_dihedral_angle_d | 23.6 |  | | X-RAY DIFFRACTION | c_improper_angle_d | 0.96 |  | | X-RAY DIFFRACTION | c_mcbond_it | 1.39 | 1.5 | | X-RAY DIFFRACTION | c_mcangle_it | 2.08 | 2 | | X-RAY DIFFRACTION | c_scbond_it | 2.15 | 2 | | X-RAY DIFFRACTION | c_scangle_it | 3.06 | 2.5 |  |  |  |  |  |  |  |  | 
 | 
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| LS精密化 シェル | 解像度: 1.95→2.07 Å / Rfactor Rfree error: 0.013  / Total num. of bins used: 6 
 |  | Rfactor | 反射数 | %反射 | 
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 | Rfree | 0.279 | 449 | 4.9 % | 
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 | Rwork | 0.244 | 8767 | - | 
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 | obs | - | 8767 | 98.6 % | 
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 | 
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| Xplor file | | Refine-ID | Serial no | Param file | Topol file | 
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 | X-RAY DIFFRACTION | 1 | PROTEIN_REP.PA | PROTEIN.TOP | X-RAY DIFFRACTION | 2 | WATER_REP.PARA | WATER.TOP | X-RAY DIFFRACTION | 3 | ION.PARAM | ION.TOP | X-RAY DIFFRACTION | 4 | ACY.PAR | ACY.TOP | X-RAY DIFFRACTION | 5 | TRS.PAR | TRS.TOP |  |  |  |  |  |  |  |  |  | 
 | 
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| ソフトウェア | *PLUS名称: CNS / バージョン: 1  / 分類: refinement | 
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| 精密化 | *PLUSσ(F): 0  / % reflection Rfree: 5.1 % | 
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| 溶媒の処理 | *PLUS | 
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| 原子変位パラメータ | *PLUSBiso  mean: 35.4 Å2 | 
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal | Dev ideal target | 
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 | X-RAY DIFFRACTION | c_angle_deg | 1.5 |  | | X-RAY DIFFRACTION | c_dihedral_angle_d |  |  | | X-RAY DIFFRACTION | c_dihedral_angle_deg | 23.6 |  | | X-RAY DIFFRACTION | c_improper_angle_d |  |  | | X-RAY DIFFRACTION | c_improper_angle_deg | 0.96 |  | | X-RAY DIFFRACTION | c_mcbond_it |  | 1.5 | | X-RAY DIFFRACTION | c_scbond_it |  | 2 | | X-RAY DIFFRACTION | c_mcangle_it |  | 2 | | X-RAY DIFFRACTION | c_scangle_it |  | 2.5 |  |  |  |  |  |  |  |  |  | 
 | 
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| LS精密化 シェル | *PLUSRfactor Rfree: 0.279  / % reflection Rfree: 4.9 % / Rfactor Rwork: 0.244 | 
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