ソフトウェア 名称 分類 CNS精密化 MAR345データ収集 SCALEPACKデータスケーリング CNS位相決定
精密化 解像度 : 1.9→6 Å / Rfactor Rfree error : 0.004 / Data cutoff high absF : 852619.12 / Data cutoff low absF : 0 / Isotropic thermal model : RESTRAINED / 交差検証法 : THROUGHOUT / σ(F) : 0 / σ(I) : 0 / 立体化学のターゲット値 : Engh & Huber詳細: For the first crystal, EMBL/DESY, HAMBURG, BEAMLINE BW6 (MAD experiment): Se L1 (0.9790 A) dmin = 20.0-2.35 No. of Reflections = 461421 No. of Unique Reflections = 36326 Completeness = 99.2 ... 詳細 : For the first crystal, EMBL/DESY, HAMBURG, BEAMLINE BW6 (MAD experiment): Se L1 (0.9790 A) dmin = 20.0-2.35 No. of Reflections = 461421 No. of Unique Reflections = 36326 Completeness = 99.2 I/SIGMA (%) = 27.5 Rsym = 6.8; Se L2 (0.9795 A) dmin = 20.0-2.35 No. of Reflections = 458264 No. of Unique Reflections = 36412 Completeness = 99.3 I/SIGMA (%) = 27.0 Rsym = 7.1' Se L3 (0.9200 A) dmin = 20.0-2.7 No. of Reflections = 275885 No. of Unique Reflections = 23838 Completeness = 98.4 I/SIGMA (%) = 38.8 Rsym = 5.5 Observed diffraction ratios : L1 x L1 = 0.0677 L1 x L2 = 0.0360 L1 x L3 = 0.0470 L2 x L2 = 0.0558 L2 x L3 = 0.0520 L3 x L3 =0.0466 For the second crystal, EMBL/DESY, HAMBURG, BEAMLINE BW7A (high-resolution data set): Se L4 (0.8428 A) dmin = 6.0-1.9 No. of Reflections = 237598 No. of Unique Reflections = 33502 Completeness = 91.2 I/SIGMA (%) = 14.4 Rsym = 9.4 (24.2)Rfactor 反射数 %反射 Selection details Rfree 0.225 3354 10 % RANDOM Rwork 0.199 - - - all 0.199 33502 - - obs 0.199 33502 94.7 % -
溶媒の処理 溶媒モデル : FLAT MODEL / Bsol : 82.45 Å2 / ksol : 0.607 e/Å3 原子変位パラメータ Biso mean : 31.8 Å2 Baniso -1 Baniso -2 Baniso -3 1- 2.65 Å2 2.38 Å2 0 Å2 2- - 2.65 Å2 0 Å2 3- - - -5.3 Å2
Refine analyze Free Obs Luzzati coordinate error 0.24 Å 0.21 Å Luzzati d res low - 5 Å Luzzati sigma a 0.14 Å 0.12 Å
精密化ステップ サイクル : LAST / 解像度 : 1.9→6 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 2759 0 0 166 2925
拘束条件 Refine-ID タイプ Dev ideal Dev ideal target X-RAY DIFFRACTION c_bond_d0.005 X-RAY DIFFRACTION c_angle_deg1.1 X-RAY DIFFRACTION c_dihedral_angle_d18.7 X-RAY DIFFRACTION c_improper_angle_d0.73 X-RAY DIFFRACTION c_mcbond_it2.096 1.5 X-RAY DIFFRACTION c_mcangle_it4.28 2 X-RAY DIFFRACTION c_scbond_it3.282 2 X-RAY DIFFRACTION c_scangle_it6.864 2.5
LS精密化 シェル 解像度 : 1.9→2.01 Å / Rfactor Rfree error : 0.01 / Total num. of bins used : 6 Rfactor 反射数 %反射 Rfree 0.252 578 10.4 % Rwork 0.223 5000 - obs - - 97.1 %
Xplor file Refine-ID Serial no Param file Topol file X-RAY DIFFRACTION 1 PROTEIN_REP.PARAMPROTEIN.TOPX-RAY DIFFRACTION 2 WATER_REP.PARAMWATER.TOP
ソフトウェア *PLUS
名称 : CNS / バージョン : 1 / 分類 : refinement精密化 *PLUS
σ(F) : 0 / % reflection Rfree : 10 %溶媒の処理 *PLUS
原子変位パラメータ *PLUS
Biso mean : 31.8 Å2 拘束条件 *PLUS
Refine-ID タイプ Dev ideal Dev ideal target X-RAY DIFFRACTION c_angle_deg1.1 X-RAY DIFFRACTION c_dihedral_angle_dX-RAY DIFFRACTION c_dihedral_angle_deg18.7 X-RAY DIFFRACTION c_improper_angle_dX-RAY DIFFRACTION c_improper_angle_deg0.73 X-RAY DIFFRACTION c_mcbond_it1.5 X-RAY DIFFRACTION c_scbond_it2 X-RAY DIFFRACTION c_mcangle_it2 X-RAY DIFFRACTION c_scangle_it2.5
LS精密化 シェル *PLUS
Rfactor Rfree : 0.252 / % reflection Rfree : 10.4 % / Rfactor Rwork : 0.223