プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.97 Å / 相対比: 1
反射
解像度: 1.83→15 Å / Num. obs: 30761 / % possible obs: 97.7 % / 冗長度: 2.9 % / Biso Wilson estimate: 13.5 Å2 / Rsym value: 0.047 / Net I/σ(I): 16
反射 シェル
解像度: 1.83→1.86 Å / 冗長度: 2.7 % / Mean I/σ(I) obs: 4.3 / Rsym value: 0.17 / % possible all: 96.9
反射
*PLUS
最高解像度: 2.15 Å / 最低解像度: 18 Å / % possible obs: 90.7 % / 冗長度: 3.2 % / Rmerge(I) obs: 0.079
反射 シェル
*PLUS
-
解析
ソフトウェア
名称
バージョン
分類
X-PLOR
3.843
精密化
DENZO
データ削減
SCALEPACK
データスケーリング
X-PLOR
3.843
位相決定
精密化
構造決定の手法: OTHER / 解像度: 2.15→18 Å / Data cutoff high absF: 1000000 / Data cutoff low absF: 100 / 交差検証法: THROUGHOUT / σ(F): 0 詳細: N-TERMINUS FROM RESIDUE 1 TO 8, IN SUBUNIT A AND 1 - 10 IN SUBUNIT B, ARE NOT VISIBLE IN THE ELECTRON DENSITY, DUE TO FLEXIBILITY. ALTERNATE POSITIONS ARE PRESENT FOR SIDE CHAIN OF RESIDUES ...詳細: N-TERMINUS FROM RESIDUE 1 TO 8, IN SUBUNIT A AND 1 - 10 IN SUBUNIT B, ARE NOT VISIBLE IN THE ELECTRON DENSITY, DUE TO FLEXIBILITY. ALTERNATE POSITIONS ARE PRESENT FOR SIDE CHAIN OF RESIDUES 19A, 39A, 114A. THE ATOMS CONCERNED HAVE OCCUPANCY BETWEEN 0.0 AND 1.0 AND A SEGID AC1 AND AC2 OFTEN, OCCUPANCY VALUES LOWER THAN 1.0 APPEARED TO JUSTIFY BETTER THE ELECTRON DENSITY. FOR THIS REASON WE HAVE KEPT THIS LOW OCCUPANCY FOR SEVERAL SIDE CHAIN ATOMS.
Rfactor
反射数
%反射
Selection details
Rfree
0.256
870
5 %
RANDOM
Rwork
0.192
-
-
-
obs
0.192
17404
90.7 %
-
原子変位パラメータ
Biso mean: 26.8 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-6.11 Å2
0 Å2
0 Å2
2-
-
3.2 Å2
0 Å2
3-
-
-
2.9 Å2
Refine analyze
Luzzati coordinate error obs: 0.32 Å / Luzzati d res low obs: 5 Å / Luzzati sigma a obs: 0.37 Å