温度: 292 K / pH: 8.5 詳細: CRYSTALS WERE GROWN IN 2.5M AMMONIUM SULFATE SOLUTION, BUFFERED WITH 20MM TRIS/ HCL TO PH 8.5. THE CRYSTALLIZATION SOLUTION WAS REPLACED IN STEPS AGAINST A SOLUTION CONTAINING 2.5M AMMONIUM ...詳細: CRYSTALS WERE GROWN IN 2.5M AMMONIUM SULFATE SOLUTION, BUFFERED WITH 20MM TRIS/ HCL TO PH 8.5. THE CRYSTALLIZATION SOLUTION WAS REPLACED IN STEPS AGAINST A SOLUTION CONTAINING 2.5M AMMONIUM SULFATE, 20MM TRIS, 300MG/ML TREHALOSE AT PH 8.5., temperature 292K
解像度: 1.5→7 Å / Data cutoff high absF: 10000000 / Data cutoff low absF: 0 / 交差検証法: free r / σ(F): 0 / 立体化学のターゲット値: ENGH AND HUBER 詳細: NO ANGLE RESTRAINTS WERE USED FOR THE CO MOLECULE AND THE HIS 93 WITH RESPECT TO THE IRON ATOM. BOND RESTRAINTS FOR THE CO MOLECULE, HIS 93 AND FOR THE PYRROLE NITROGEN TO THE IRON ATOM WERE ...詳細: NO ANGLE RESTRAINTS WERE USED FOR THE CO MOLECULE AND THE HIS 93 WITH RESPECT TO THE IRON ATOM. BOND RESTRAINTS FOR THE CO MOLECULE, HIS 93 AND FOR THE PYRROLE NITROGEN TO THE IRON ATOM WERE WEAKENED FROM THE STANDARD X-PLOR VALUES (PARAM19X.HEME). THERE IS NEARLY NO ELECTRON DENSITY FOR THE N-FORMYL-MET. THIS RESIDUE WAS NOT INCLUDED INTO THE MODEL. ELECTRON DENSITY FEATURES CLOSE TO THIS SITE WERE MODELED BY WATER MOLECULES. ONE TREHALOSE MOLECULE IS BOUND TO THE SURFACE OF THE MYOGLOBIN MOLECULE. THE WATER MOLECULES NUMBER 246 AND 252 ARE ON OR CLOSE TO SPECIAL POSITIONS.
Rfactor
反射数
%反射
Selection details
Rfree
0.215
3190
-
RANDOM
Rwork
0.189
-
-
-
all
0.192
31820
-
-
obs
0.192
31820
94.5 %
-
Refine analyze
Luzzati d res low obs: 7 Å / Luzzati sigma a obs: 0.14 Å
精密化ステップ
サイクル: LAST / 解像度: 1.5→7 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1223
0
78
191
1492
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
X-RAY DIFFRACTION
x_bond_d
0.007
X-RAY DIFFRACTION
x_bond_d_na
X-RAY DIFFRACTION
x_bond_d_prot
X-RAY DIFFRACTION
x_angle_d
X-RAY DIFFRACTION
x_angle_d_na
X-RAY DIFFRACTION
x_angle_d_prot
X-RAY DIFFRACTION
x_angle_deg
1.1
X-RAY DIFFRACTION
x_angle_deg_na
X-RAY DIFFRACTION
x_angle_deg_prot
X-RAY DIFFRACTION
x_dihedral_angle_d
17.9
X-RAY DIFFRACTION
x_dihedral_angle_d_na
X-RAY DIFFRACTION
x_dihedral_angle_d_prot
X-RAY DIFFRACTION
x_improper_angle_d
1.27
X-RAY DIFFRACTION
x_improper_angle_d_na
X-RAY DIFFRACTION
x_improper_angle_d_prot
X-RAY DIFFRACTION
x_mcbond_it
1.5
X-RAY DIFFRACTION
x_mcangle_it
2
X-RAY DIFFRACTION
x_scbond_it
2
X-RAY DIFFRACTION
x_scangle_it
2.5
LS精密化 シェル
解像度: 1.5→1.57 Å / Total num. of bins used: 8
Rfactor
反射数
%反射
Rfree
0.257
337
-
Rwork
0.236
3093
-
obs
-
-
81.9 %
Xplor file
Refine-ID
Serial no
Param file
Topol file
X-RAY DIFFRACTION
1
PARHCSDX.PRO
tophcsdx.pro
X-RAY DIFFRACTION
2
PARAM19X.HEME
toph19x.heme
ソフトウェア
*PLUS
名称: X-PLOR / バージョン: 3.1 / 分類: refinement
精密化
*PLUS
最高解像度: 1.5 Å / 最低解像度: 7 Å / σ(F): 0 / Rfactor obs: 0.189