| ソフトウェア | | 名称 | バージョン | 分類 |
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X-PLOR | | モデル構築 | X-PLOR | 3.851 | 精密化 | | SDMS | | データ削減 | | SDMS | | データスケーリング | X-PLOR | | 位相決定 |
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| 精密化 | 解像度: 1.85→10 Å / Rfactor Rfree error: 0.004 / Data cutoff high absF: 10000000 / Data cutoff low absF: 0.001 / Isotropic thermal model: RESTRAINED / 交差検証法: A POSTERIORI / σ(F): 0 / σ(I): 0 / 立体化学のターゲット値: Engh & Huber
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.202 | 2275 | 10 % | RANDOM |
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| Rwork | 0.166 | - | - | - |
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| obs | 0.166 | 22650 | 93.5 % | - |
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| all | - | 22650 | - | - |
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| 原子変位パラメータ | Biso mean: 14.6 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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| 1- | 0 Å2 | 0 Å2 | 0 Å2 |
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| 2- | - | 0 Å2 | 0 Å2 |
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| 3- | - | - | 0 Å2 |
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| Refine analyze | | Free | Obs |
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| Luzzati coordinate error | 0.2 Å | 0.17 Å |
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| Luzzati d res low | - | 5 Å |
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| Luzzati sigma a | 0.19 Å | 0.16 Å |
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| 精密化ステップ | サイクル: LAST / 解像度: 1.85→10 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 1314 | 0 | 36 | 251 | 1601 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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| X-RAY DIFFRACTION | x_bond_d| 0.009 | | | X-RAY DIFFRACTION | x_bond_d_na | | | X-RAY DIFFRACTION | x_bond_d_prot | | | X-RAY DIFFRACTION | x_angle_d | | | X-RAY DIFFRACTION | x_angle_d_na | | | X-RAY DIFFRACTION | x_angle_d_prot | | | X-RAY DIFFRACTION | x_angle_deg| 1.4 | | | X-RAY DIFFRACTION | x_angle_deg_na | | | X-RAY DIFFRACTION | x_angle_deg_prot | | | X-RAY DIFFRACTION | x_dihedral_angle_d| 24.5 | | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | | X-RAY DIFFRACTION | x_improper_angle_d| 1.4 | | | X-RAY DIFFRACTION | x_improper_angle_d_na | | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | | X-RAY DIFFRACTION | x_mcbond_it| 1.34 | 1.5 | | X-RAY DIFFRACTION | x_mcangle_it| 1.99 | 2 | | X-RAY DIFFRACTION | x_scbond_it| 2.7 | 2 | | X-RAY DIFFRACTION | x_scangle_it| 4.12 | 2.5 | | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 1.85→1.97 Å / Rfactor Rfree error: 0.014 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
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| Rfree | 0.257 | 350 | 9.6 % |
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| Rwork | 0.214 | 3292 | - |
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| obs | - | - | 91.3 % |
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| Xplor file | | Refine-ID | Serial no | Param file | Topol file |
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| X-RAY DIFFRACTION | 1 | PARHCSDX.PROTOPHCSDX.PRO| X-RAY DIFFRACTION | 2 | PARAM.REDFMNTOPH.FMN| X-RAY DIFFRACTION | 3 | PARAM.WATTOPH.WAT| X-RAY DIFFRACTION | 4 | PARAM.POLY| TOPH.SO4 | | | | | | | |
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| ソフトウェア | *PLUS 名称: X-PLOR(ONLINE) / バージョン: 3.851 / 分類: refinement |
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| 精密化 | *PLUS σ(F): 0 / % reflection Rfree: 10 % |
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| 溶媒の処理 | *PLUS |
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| 原子変位パラメータ | *PLUS Biso mean: 14.6 Å2 |
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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| X-RAY DIFFRACTION | x_angle_deg| 1.4 | | | X-RAY DIFFRACTION | x_dihedral_angle_d | | | X-RAY DIFFRACTION | x_dihedral_angle_deg| 24.5 | | | X-RAY DIFFRACTION | x_improper_angle_d | | | X-RAY DIFFRACTION | x_improper_angle_deg| 1.4 | | | X-RAY DIFFRACTION | x_mcbond_it | 1.5 | | X-RAY DIFFRACTION | x_scbond_it | 2 | | X-RAY DIFFRACTION | x_mcangle_it | 2 | | X-RAY DIFFRACTION | x_scangle_it | 2.5 | | | | | | | | | |
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| LS精密化 シェル | *PLUS Rfactor Rfree: 0.257 / % reflection Rfree: 9.6 % / Rfactor Rwork: 0.214 |
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