ソフトウェア | 名称 | バージョン | 分類 |
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XDS | | データスケーリング | AUTOMAR | | データ削減 | X-PLOR | 3.851 | 精密化 | XDS | | データ削減 |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 2.3→10 Å / Rfactor Rfree error: 0.012 / Data cutoff high absF: 10000000 / Data cutoff low absF: 0.001 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 1
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.27 | 472 | 10.8 % | RANDOM |
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Rwork | 0.245 | - | - | - |
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obs | - | 4968 | 82 % | - |
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原子変位パラメータ | Biso mean: 25.4 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.4 Å | 0.37 Å |
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Luzzati d res low | - | 3.8 Å |
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Luzzati sigma a | 0.38 Å | 0.44 Å |
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精密化ステップ | サイクル: LAST / 解像度: 2.3→10 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 1138 | 0 | 5 | 54 | 1197 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_bond_d0.01 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg1.17 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d24.7 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d2.14 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it3.55 | 1.5 | X-RAY DIFFRACTION | x_mcangle_it5.34 | 2 | X-RAY DIFFRACTION | x_scbond_it6.25 | 2 | X-RAY DIFFRACTION | x_scangle_it9.38 | 2.5 | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.3→2.42 Å / Rfactor Rfree error: 0.044 / Total num. of bins used: 7
| Rfactor | 反射数 | %反射 |
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Rfree | 0.329 | 56 | 11.5 % |
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Rwork | 0.282 | 433 | - |
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obs | - | - | 65.5 % |
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ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.851 / 分類: refinement |
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精密化 | *PLUS σ(F): 1 / Rfactor obs: 0.234 / Rfactor Rfree: 0.27 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS Biso mean: 25.4 Å2 |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_bond_d0.01 | | X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg24.7 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg2.14 | | X-RAY DIFFRACTION | x_mcbond_it | 1.5 | X-RAY DIFFRACTION | x_scbond_it | 2 | X-RAY DIFFRACTION | x_mcangle_it | 2 | X-RAY DIFFRACTION | x_scangle_it | 2.5 | | | | | | | | | |
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LS精密化 シェル | *PLUS Rfactor Rfree: 0.329 / % reflection Rfree: 11.5 % / Rfactor Rwork: 0.282 |
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