| ソフトウェア | | 名称 | バージョン | 分類 |
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X-PLOR | | モデル構築 | X-PLOR | 3.1 | 精密化 | | SCALEPACK | | データスケーリング | X-PLOR | | 位相決定 |
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| 精密化 | 構造決定の手法: OTHER 開始モデル: PDB ENTRY 1OYA 解像度: 2.3→8 Å / Data cutoff high absF: 10000000 / Data cutoff low absF: 0.0001 / 交差検証法: THROUGHOUT / σ(F): 2
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.254 | 1477 | 8 % | RANDOM |
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| Rwork | 0.18 | - | - | - |
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| obs | 0.18 | 17205 | 75.2 % | - |
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| 原子変位パラメータ | Biso mean: 21.5 Å2 |
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| 精密化ステップ | サイクル: LAST / 解像度: 2.3→8 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 3173 | 0 | 31 | 127 | 3331 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_bond_d| 0.008 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg| 1.5 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d| 24.5 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d| 1.29 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it | | X-RAY DIFFRACTION | x_mcangle_it | | X-RAY DIFFRACTION | x_scbond_it | | X-RAY DIFFRACTION | x_scangle_it | | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 2.3→2.4 Å / Total num. of bins used: 8
| Rfactor | 反射数 | %反射 |
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| Rfree | 0.367 | 59 | - |
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| Rwork | 0.265 | 994 | - |
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| obs | - | - | 43.3 % |
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| Xplor file | | Refine-ID | Serial no | Param file |
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| X-RAY DIFFRACTION | 1 | PARHCSDX.PRO| X-RAY DIFFRACTION | 2 | PARAM19.SOL| X-RAY DIFFRACTION | 3 | PARAFMN.PRO | | |
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| ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.1 / 分類: refinement |
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| 精密化 | *PLUS 最高解像度: 2.3 Å / 最低解像度: 8 Å / σ(F): 2 / % reflection Rfree: 8 % / Rfactor obs: 0.18 / Rfactor Rwork: 0.18 |
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| 溶媒の処理 | *PLUS |
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| 原子変位パラメータ | *PLUS Biso mean: 21.5 Å2 |
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_angle_deg| 1.5 | | X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg| 24.5 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg| 1.29 | | | | | |
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| LS精密化 シェル | *PLUS 最高解像度: 2.3 Å / 最低解像度: 2.4 Å / Rfactor Rfree: 0.367 / Rfactor Rwork: 0.265 |
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