タイプ: RIGAKU / 検出器: IMAGE PLATE / 日付: 1996年6月1日 / 詳細: FRANCKS MIRRORS (SUPPER 2 X 6 CM MIRRORS)
放射
モノクロメーター: NI FILTER / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1.5418 Å / 相対比: 1
反射
解像度: 1.95→20 Å / Num. obs: 28798 / % possible obs: 95.4 % / 冗長度: 3.4 % / Biso Wilson estimate: 20.4 Å2 / Rmerge(I) obs: 0.06 / Rsym value: 0.06 / Net I/σ(I): 20
反射 シェル
解像度: 1.95→2.02 Å / 冗長度: 3.3 % / Rmerge(I) obs: 0.06 / Mean I/σ(I) obs: 4.5 / Rsym value: 0.24 / % possible all: 95
反射
*PLUS
Num. measured all: 99253 / Rmerge(I) obs: 0.06
反射 シェル
*PLUS
Rmerge(I) obs: 0.243
-
解析
ソフトウェア
名称
バージョン
分類
X-PLOR
モデル構築
CNS
0.1
精密化
X-PLOR
精密化
DENZO
データ削減
SCALEPACK
データスケーリング
X-PLOR
位相決定
精密化
構造決定の手法: DIFFERENCE FOURIER FROM PREVIOUSLY DETERMINED, RELATED STRUCTURE 開始モデル: UNLIGANDED ECORL 解像度: 1.95→6 Å / Rfactor Rfree error: 0.005 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0 詳細: ALPHA AND BETA ANOMERS (O1) OF D-GALACTOSE WERE REFINED; FINAL OCCUPANCY OF ALPHA ANOMER IS 0.45, THAT OF BETA ANOMER IS 0.55. THE REST OF THE GALACTOSE MOLECULES WAS REFINED AS TWO IDENTICAL ...詳細: ALPHA AND BETA ANOMERS (O1) OF D-GALACTOSE WERE REFINED; FINAL OCCUPANCY OF ALPHA ANOMER IS 0.45, THAT OF BETA ANOMER IS 0.55. THE REST OF THE GALACTOSE MOLECULES WAS REFINED AS TWO IDENTICAL MOLECULES, GLA AND GAL (401 AND 402, RESPECTIVELY), WITH FIXED OCCUPANCIES OF 0.5.
Rfactor
反射数
%反射
Selection details
Rfree
0.206
1710
6.1 %
RANDOM
Rwork
0.179
-
-
-
obs
0.179
27809
99.5 %
-
原子変位パラメータ
Biso mean: 23.2 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-3.39 Å2
0 Å2
0.51 Å2
2-
-
2.18 Å2
0 Å2
3-
-
-
1.2 Å2
Refine analyze
Free
Obs
Luzzati coordinate error
0.22 Å
0.19 Å
Luzzati d res low
-
5 Å
Luzzati sigma a
0.09 Å
0.12 Å
精密化ステップ
サイクル: LAST / 解像度: 1.95→6 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1855
0
106
135
2096
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
X-RAY DIFFRACTION
c_bond_d
0.005
X-RAY DIFFRACTION
c_bond_d_na
X-RAY DIFFRACTION
c_bond_d_prot
X-RAY DIFFRACTION
c_angle_d
X-RAY DIFFRACTION
c_angle_d_na
X-RAY DIFFRACTION
c_angle_d_prot
X-RAY DIFFRACTION
c_angle_deg
1.4
X-RAY DIFFRACTION
c_angle_deg_na
X-RAY DIFFRACTION
c_angle_deg_prot
X-RAY DIFFRACTION
c_dihedral_angle_d
27.2
X-RAY DIFFRACTION
c_dihedral_angle_d_na
X-RAY DIFFRACTION
c_dihedral_angle_d_prot
X-RAY DIFFRACTION
c_improper_angle_d
1.17
X-RAY DIFFRACTION
c_improper_angle_d_na
X-RAY DIFFRACTION
c_improper_angle_d_prot
X-RAY DIFFRACTION
c_mcbond_it
1.45
1.5
X-RAY DIFFRACTION
c_mcangle_it
2.15
2
X-RAY DIFFRACTION
c_scbond_it
2.59
2
X-RAY DIFFRACTION
c_scangle_it
3.86
2.5
LS精密化 シェル
解像度: 1.95→2.02 Å / Rfactor Rfree error: 0.016 / Total num. of bins used: 10