解像度: 2.4→20 Å / Num. obs: 30000 / % possible obs: 98 % / Observed criterion σ(I): 0 / 冗長度: 3 % / Biso Wilson estimate: 20 Å2 / Rsym value: 0.079 / Net I/σ(I): 10
反射 シェル
解像度: 2.4→2.5 Å / 冗長度: 3 % / Mean I/σ(I) obs: 4 / Rsym value: 0.29 / % possible all: 98
反射
*PLUS
Num. measured all: 96285 / Rmerge(I) obs: 0.079
-
解析
ソフトウェア
名称
バージョン
分類
PHASES
位相決定
X-PLOR
3.1
モデル構築
X-PLOR
3.1
精密化
DENZO
データ削減
SCALEPACK
データスケーリング
X-PLOR
3.1
位相決定
精密化
構造決定の手法: HEAVY ATOMS: ISOMORPHOUS, ANOMALOUS SIGNALS 解像度: 2.4→8 Å / Rfactor Rfree error: 0.02 / Data cutoff high absF: 100000 / Data cutoff low absF: 0.001 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 2 詳細: OF THE THREE MOLECULES IN THE ASYMMETRIC UNIT, THE CONFORMATION OF N TERMINAL REGION IS TRULY REPRESENTED BY CHAINS A AND C AND SHOWS A STRAND EXCHANGE PHENOMENON. HOWEVER, THIS COULD NOT BE ...詳細: OF THE THREE MOLECULES IN THE ASYMMETRIC UNIT, THE CONFORMATION OF N TERMINAL REGION IS TRULY REPRESENTED BY CHAINS A AND C AND SHOWS A STRAND EXCHANGE PHENOMENON. HOWEVER, THIS COULD NOT BE CLEARLY SEEN IN CHAIN B SINCE THERE ARE SOME MISSING RESIDUES. FOR COMPLETE DESCRIPTION PLEASE SEE THE REFERENCED JOURNAL.
Rfactor
反射数
%反射
Selection details
Rfree
0.32
2000
8 %
RANDOM
Rwork
0.225
-
-
-
obs
0.225
25000
98 %
-
原子変位パラメータ
Biso mean: 17 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.4→8 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
531
0
3
0
534
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
X-RAY DIFFRACTION
x_bond_d
0.02
X-RAY DIFFRACTION
x_bond_d_na
X-RAY DIFFRACTION
x_bond_d_prot
X-RAY DIFFRACTION
x_angle_d
X-RAY DIFFRACTION
x_angle_d_na
X-RAY DIFFRACTION
x_angle_d_prot
X-RAY DIFFRACTION
x_angle_deg
2.1
X-RAY DIFFRACTION
x_angle_deg_na
X-RAY DIFFRACTION
x_angle_deg_prot
X-RAY DIFFRACTION
x_dihedral_angle_d
28
X-RAY DIFFRACTION
x_dihedral_angle_d_na
X-RAY DIFFRACTION
x_dihedral_angle_d_prot
X-RAY DIFFRACTION
x_improper_angle_d
2
X-RAY DIFFRACTION
x_improper_angle_d_na
X-RAY DIFFRACTION
x_improper_angle_d_prot
X-RAY DIFFRACTION
x_mcbond_it
5
5
X-RAY DIFFRACTION
x_mcangle_it
5
5
X-RAY DIFFRACTION
x_scbond_it
5
5
X-RAY DIFFRACTION
x_scangle_it
5
5
Refine LS restraints NCS
NCS model details: RESTRAINTS / Rms dev Biso: 10 Å2 / Rms dev position: 1.5 Å / Weight Biso: 2 / Weight position: 200
LS精密化 シェル
解像度: 2.4→2.5 Å / Rfactor Rfree error: 0.04 / Total num. of bins used: 12