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- EMDB-24782: in situ cryo-electron tomogram of nvj1-ko yeast lipid droplet aft... -
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Open data
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Basic information
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Title | in situ cryo-electron tomogram of nvj1-ko yeast lipid droplet after 4-hour exposure to acute glucose restriction (AGR, 0.001% glucose media) | |||||||||||||||
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Biological species | ![]() ![]() | |||||||||||||||
Method | electron tomography / cryo EM | |||||||||||||||
![]() | Rogers S / Gui L / Kovalenko A / Reetz E / Nicastro D / Henne WM | |||||||||||||||
Funding support | ![]()
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![]() | ![]() Title: Liquid-crystalline lipid phase transitions in lipid droplets selectively remodel the LD proteome Authors: Rogers S / Gui L / Kovalenko A / Reetz E / Nicastro D / Henne WM | |||||||||||||||
History |
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Structure visualization
Supplemental images |
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Downloads & links
-EMDB archive
Map data | ![]() | 95.1 MB | ![]() | |
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Header (meta data) | ![]() ![]() | 8.2 KB 8.2 KB | Display Display | ![]() |
Images | ![]() | 171.2 KB | ||
Archive directory | ![]() ![]() | HTTPS FTP |
-Related structure data
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Links
EMDB pages | ![]() ![]() |
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Map
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Voxel size | X=Y=Z: 5.684 Å | ||||||||||||||||||||
Density |
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Symmetry | Space group: 1 | ||||||||||||||||||||
Details | EMDB XML:
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-Supplemental data
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Sample components
-Entire : lipid droplet of nvj1 yeast after 4-hour exposure to acute glucos...
Entire | Name: lipid droplet of nvj1 yeast after 4-hour exposure to acute glucose restriction (AGR, 0.001% glucose media) |
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Components |
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-Supramolecule #1: lipid droplet of nvj1 yeast after 4-hour exposure to acute glucos...
Supramolecule | Name: lipid droplet of nvj1 yeast after 4-hour exposure to acute glucose restriction (AGR, 0.001% glucose media) type: cell / ID: 1 / Parent: 0 |
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Source (natural) | Organism: ![]() ![]() |
-Experimental details
-Structure determination
Method | cryo EM |
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![]() | electron tomography |
Aggregation state | cell |
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Sample preparation
Buffer | pH: 7 |
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Vitrification | Cryogen name: ETHANE |
Sectioning | Focused ion beam - Instrument: OTHER / Focused ion beam - Ion: OTHER / Focused ion beam - Voltage: 30 kV / Focused ion beam - Current: 0.01 nA / Focused ion beam - Duration: 600 sec. / Focused ion beam - Temperature: 88 K / Focused ion beam - Initial thickness: 1000 nm / Focused ion beam - Final thickness: 150 nm Focused ion beam - Details: The value given for _emd_sectioning_focused_ion_beam.instrument is FEI Aquilos. This is not in a list of allowed values {'OTHER', 'DB235'} so OTHER is written into the XML file. |
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Electron microscopy
Microscope | FEI TITAN KRIOS |
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Image recording | Film or detector model: GATAN K3 (6k x 4k) / Average electron dose: 1.5 e/Å2 |
Electron beam | Acceleration voltage: 300 kV / Electron source: ![]() |
Electron optics | Illumination mode: FLOOD BEAM / Imaging mode: BRIGHT FIELD |
Experimental equipment | ![]() Model: Titan Krios / Image courtesy: FEI Company |
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Image processing
Final reconstruction | Number images used: 57 |
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