Journal: Cell Rep / Year: 2023 Title: The architecture of Cidec-mediated interfaces between lipid droplets. Authors: Iva Ganeva / Koini Lim / Jerome Boulanger / Patrick C Hoffmann / Olivia Muriel / Alicia C Borgeaud / Wim J H Hagen / David B Savage / Wanda Kukulski / Abstract: Lipid droplets (LDs) are intracellular organelles responsible for storing surplus energy as neutral lipids. Their size and number vary enormously. In white adipocytes, LDs can reach 100 μm in ...Lipid droplets (LDs) are intracellular organelles responsible for storing surplus energy as neutral lipids. Their size and number vary enormously. In white adipocytes, LDs can reach 100 μm in diameter, occupying >90% of the cell. Cidec, which is strictly required for the formation of large LDs, is concentrated at interfaces between adjacent LDs and facilitates directional flux of neutral lipids from the smaller to the larger LD. The mechanism of lipid transfer is unclear, in part because the architecture of interfaces between LDs remains elusive. Here we visualize interfaces between LDs by electron cryo-tomography and analyze the kinetics of lipid transfer by quantitative live fluorescence microscopy. We show that transfer occurs through closely apposed monolayers, is slowed down by increasing the distance between the monolayers, and follows exponential kinetics. Our data corroborate the notion that Cidec facilitates pressure-driven transfer of neutral lipids through two "leaky" monolayers between LDs.
Focused ion beam - Instrument: OTHER / Focused ion beam - Ion: OTHER / Focused ion beam - Voltage: 30 kV / Focused ion beam - Current: 1 nA / Focused ion beam - Duration: 2000 sec. / Focused ion beam - Temperature: 100 K / Focused ion beam - Initial thickness: 1000 nm / Focused ion beam - Final thickness: 100 nm Focused ion beam - Details: Rough milling: 30 kV, 1-0.1 nA. Fine milling: 16kV, 23 pA.. The value given for _em_focused_ion_beam.instrument is FEI Scios. This is not in a list of allowed values ...Focused ion beam - Details: Rough milling: 30 kV, 1-0.1 nA. Fine milling: 16kV, 23 pA.. The value given for _em_focused_ion_beam.instrument is FEI Scios. This is not in a list of allowed values {'OTHER', 'DB235'} so OTHER is written into the XML file.
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Electron microscopy
Microscope
FEI TITAN KRIOS
Image recording
Film or detector model: GATAN K2 SUMMIT (4k x 4k) / Detector mode: COUNTING / Average electron dose: 1.0 e/Å2
Electron beam
Acceleration voltage: 300 kV / Electron source: FIELD EMISSION GUN
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