| ソフトウェア | | 名称 | 分類 |
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X-PLOR | モデル構築 | X-PLOR | 精密化 | | DENZO | データ削減 | X-PLOR | 位相決定 |
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| 精密化 | 構造決定の手法: 分子置換 開始モデル: BDL020 解像度: 2.6→8 Å / σ(F): 2 / | Rfactor | 反射数 |
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| Rfree | 0.238 | - |
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| Rwork | 0.178 | - |
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| obs | 0.178 | 1888 |
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| Refine Biso | | クラス | Refine-ID | 詳細 | Treatment |
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ALL ATOMS| X-RAY DIFFRACTION | TRisotropicALL WATERS| X-RAY DIFFRACTION | TR| isotropic | | | | | |
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| 精密化ステップ | サイクル: LAST / 解像度: 2.6→8 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 0 | 486 | 37 | 76 | 599 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_bond_d| 0.022 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg| 1.61 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it | | X-RAY DIFFRACTION | x_mcangle_it | | X-RAY DIFFRACTION | x_scbond_it | | X-RAY DIFFRACTION | x_scangle_it | | | | | | | | | | | | | | | | | | | |
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| ソフトウェア | *PLUS 名称: X-PLOR / 分類: refinement |
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| 精密化 | *PLUS 最高解像度: 2.6 Å / 最低解像度: 8 Å / σ(F): 2 / % reflection Rfree: 10 % |
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| 溶媒の処理 | *PLUS |
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| 原子変位パラメータ | *PLUS |
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